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Statements

Subject Item
n2:RIV%2F68081723%3A_____%2F12%3A00385390%21RIV13-GA0-68081723
rdf:type
n12:Vysledek skos:Concept
dcterms:description
Depth profiling mode of MiniSIMS device was applied to diffusion measurement. Calibration of crater depth was done using shearing interference microscope Zeiss Epival Interphako (ZEI) and confocal mikroskope Olympus LEXT OLS3100 with atomic force microscopy (AFM) modul. The ZEI uses one of the classical interferometric measuring methods. Generally this method leads to results with considerable experimental error. AFM is a very high-resolution type of scanning probe microscopy, with typical resolution of the order of fractions of nanometers, which is more than 1000 times better than the optical diffraction limit. However, the results taken by ZEI were in agreement with much more precise results of surface profiling achieved by AFM. It was found, at given experimental conditions (Fe-rich matrix, Ga + primary ions, 5 kV/3nA, DWT=1), that the sputter rate is some 0.3 nm per a single sputter scan of the crater area (50x50 µm). This depth calibration with SIMS technique can be applied to the study of carbon diffusion in BCC iron as an example. Special technique was developed, which avoids radio-tracer measurements with C-14. Obtained results are lower than the extrapolated values, which may be due to limited solubility of carbon in iron. Depth profiling mode of MiniSIMS device was applied to diffusion measurement. Calibration of crater depth was done using shearing interference microscope Zeiss Epival Interphako (ZEI) and confocal mikroskope Olympus LEXT OLS3100 with atomic force microscopy (AFM) modul. The ZEI uses one of the classical interferometric measuring methods. Generally this method leads to results with considerable experimental error. AFM is a very high-resolution type of scanning probe microscopy, with typical resolution of the order of fractions of nanometers, which is more than 1000 times better than the optical diffraction limit. However, the results taken by ZEI were in agreement with much more precise results of surface profiling achieved by AFM. It was found, at given experimental conditions (Fe-rich matrix, Ga + primary ions, 5 kV/3nA, DWT=1), that the sputter rate is some 0.3 nm per a single sputter scan of the crater area (50x50 µm). This depth calibration with SIMS technique can be applied to the study of carbon diffusion in BCC iron as an example. Special technique was developed, which avoids radio-tracer measurements with C-14. Obtained results are lower than the extrapolated values, which may be due to limited solubility of carbon in iron.
dcterms:title
Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth
skos:prefLabel
Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth Measurement of Carbon Diffusion Coeficient - Calibration of Sputter Depth
skos:notation
RIV/68081723:_____/12:00385390!RIV13-GA0-68081723
n12:predkladatel
n13:ico%3A68081723
n3:aktivita
n11:Z n11:P n11:I
n3:aktivity
I, P(GAP108/11/0148), Z(AV0Z20410507)
n3:dodaniDat
n4:2013
n3:domaciTvurceVysledku
n10:9424342 n10:8032564
n3:druhVysledku
n19:D
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n21:predkladatel
n3:idSjednocenehoVysledku
148857
n3:idVysledku
RIV/68081723:_____/12:00385390
n3:jazykVysledku
n17:eng
n3:klicovaSlova
carbon diffusion; ferrite; SIMS; carbides
n3:klicoveSlovo
n15:SIMS n15:carbides n15:carbon%20diffusion n15:ferrite
n3:kontrolniKodProRIV
[FED3C4E08610]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Ostrava
n3:nazevZdroje
METAL 2012 Conference Proceedings
n3:obor
n6:BJ
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n8:GAP108%2F11%2F0148
n3:rokUplatneniVysledku
n4:2012
n3:tvurceVysledku
Čermák, Jiří Král, Lubomír
n3:typAkce
n16:WRD
n3:zahajeniAkce
2012-05-23+02:00
n3:zamer
n20:AV0Z20410507
s:numberOfPages
2
n5:hasPublisher
TANGER Ltd. Ostrava
n18:isbn
978-80-87294-31-4