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Statements

Subject Item
n2:RIV%2F68081723%3A_____%2F11%3A00368997%21RIV12-AV0-68081723
rdf:type
skos:Concept n10:Vysledek
dcterms:description
Mechanical properties of an aluminium thin film were measured by microcompression and indentation tests. The microcompression technique combines preparation of specimens using focused ion beam (FIB) and compression test by a nanoindeter device. Cylindrical specimens were prepared by focused ion beam milling. The height of cylindrical specimens was about 2 micrometers and their diameter about 1,3 micrometers. The load and displacement were continuously measured during tests. The stress-strain curves were obtained in two representations. Stresses of the first plastic bursts were determined in both representations. Hardness and Young modulus were measured by indentation test using continuous stiffness method. Representative values of thin film were calculated Mechanical properties of an aluminium thin film were measured by microcompression and indentation tests. The microcompression technique combines preparation of specimens using focused ion beam (FIB) and compression test by a nanoindeter device. Cylindrical specimens were prepared by focused ion beam milling. The height of cylindrical specimens was about 2 micrometers and their diameter about 1,3 micrometers. The load and displacement were continuously measured during tests. The stress-strain curves were obtained in two representations. Stresses of the first plastic bursts were determined in both representations. Hardness and Young modulus were measured by indentation test using continuous stiffness method. Representative values of thin film were calculated
dcterms:title
Mechanical properties of Al thin film measured by two different methods Mechanical properties of Al thin film measured by two different methods
skos:prefLabel
Mechanical properties of Al thin film measured by two different methods Mechanical properties of Al thin film measured by two different methods
skos:notation
RIV/68081723:_____/11:00368997!RIV12-AV0-68081723
n10:predkladatel
n12:ico%3A68081723
n3:aktivita
n8:S n8:Z
n3:aktivity
S, Z(AV0Z20410507)
n3:cisloPeriodika
3
n3:dodaniDat
n11:2012
n3:domaciTvurceVysledku
n17:5413206 n17:2240750
n3:druhVysledku
n7:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n4:predkladatel
n3:idSjednocenehoVysledku
211233
n3:idVysledku
RIV/68081723:_____/11:00368997
n3:jazykVysledku
n18:eng
n3:klicovaSlova
thin films; focused ion beam; aluminium; nanoindentation
n3:klicoveSlovo
n13:nanoindentation n13:aluminium n13:focused%20ion%20beam n13:thin%20films
n3:kodStatuVydavatele
SK - Slovenská republika
n3:kontrolniKodProRIV
[44960282CCCC]
n3:nazevZdroje
Acta Metallurgica Slovaca
n3:obor
n16:JJ
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:rokUplatneniVysledku
n11:2011
n3:svazekPeriodika
17
n3:tvurceVysledku
Kuběna, Ivo Kruml, Tomáš
n3:zamer
n5:AV0Z20410507
s:issn
1338-1156
s:numberOfPages
6