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Statements

Subject Item
n2:RIV%2F67985882%3A_____%2F08%3A00325819%21RIV10-AV0-67985882
rdf:type
skos:Concept n12:Vysledek
dcterms:description
This Letter presents a new method - comparative surface plsmon spectroscopy (CSPS) - which enables accurate determination of a refractive index of a low-loss dielectric film independently of its thickness. This Letter presents a new method - comparative surface plsmon spectroscopy (CSPS) - which enables accurate determination of a refractive index of a low-loss dielectric film independently of its thickness.
dcterms:title
Comparative surface plasmon spectroscopy for characterization of thin films Comparative surface plasmon spectroscopy for characterization of thin films
skos:prefLabel
Comparative surface plasmon spectroscopy for characterization of thin films Comparative surface plasmon spectroscopy for characterization of thin films
skos:notation
RIV/67985882:_____/08:00325819!RIV10-AV0-67985882
n3:aktivita
n11:P n11:Z
n3:aktivity
P(KAN200670701), Z(AV0Z20670512)
n3:cisloPeriodika
18
n3:dodaniDat
n13:2010
n3:domaciTvurceVysledku
n18:9632689
n3:druhVysledku
n8:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n14:predkladatel
n3:idSjednocenehoVysledku
360518
n3:idVysledku
RIV/67985882:_____/08:00325819
n3:jazykVysledku
n5:eng
n3:klicovaSlova
surface plasmons; thin films; spectroscopy
n3:klicoveSlovo
n10:thin%20films n10:spectroscopy n10:surface%20plasmons
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[03DEBB7E5CF0]
n3:nazevZdroje
Electronics Letters
n3:obor
n15:JB
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
2
n3:projekt
n17:KAN200670701
n3:rokUplatneniVysledku
n13:2008
n3:svazekPeriodika
44
n3:tvurceVysledku
Homola, Jiří Hlavenková, Z.
n3:wos
000259154600026
n3:zamer
n9:AV0Z20670512
s:issn
0013-5194
s:numberOfPages
3