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Statements

Subject Item
n2:RIV%2F67985556%3A_____%2F12%3A00384216%21RIV13-AV0-67985556
rdf:type
skos:Concept n8:Vysledek
dcterms:description
Capturing appearance of material with respect to illumination and viewing directions is crucial to achieve realistic visual experience in virtual environments. The capturing process is time demanding or requires a specific shape of the captured material. Therefore, we propose a method of such a data reconstruction from very sparse measurements, whose placement allows for continuous and fast acquisition, from which can benefit future acquisition setups. The proposed approach was tested on a number of view- and illumination- dependent samples and showed a promising performance in terms of whole data-space reconstruction speed and visual quality. Capturing appearance of material with respect to illumination and viewing directions is crucial to achieve realistic visual experience in virtual environments. The capturing process is time demanding or requires a specific shape of the captured material. Therefore, we propose a method of such a data reconstruction from very sparse measurements, whose placement allows for continuous and fast acquisition, from which can benefit future acquisition setups. The proposed approach was tested on a number of view- and illumination- dependent samples and showed a promising performance in terms of whole data-space reconstruction speed and visual quality.
dcterms:title
Restoring Illumination and View Dependent Data from Sparse Samples Restoring Illumination and View Dependent Data from Sparse Samples
skos:prefLabel
Restoring Illumination and View Dependent Data from Sparse Samples Restoring Illumination and View Dependent Data from Sparse Samples
skos:notation
RIV/67985556:_____/12:00384216!RIV13-AV0-67985556
n8:predkladatel
n9:ico%3A67985556
n3:aktivita
n14:P n14:I
n3:aktivity
I, P(GA102/08/0593), P(GAP103/11/0335)
n3:dodaniDat
n7:2013
n3:domaciTvurceVysledku
n10:2007673
n3:druhVysledku
n19:D
n3:duvernostUdaju
n5:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
165312
n3:idVysledku
RIV/67985556:_____/12:00384216
n3:jazykVysledku
n15:eng
n3:klicovaSlova
reflectance measurement; BRDF reconstruction; sparse
n3:klicoveSlovo
n11:sparse n11:reflectance%20measurement n11:BRDF%20reconstruction
n3:kontrolniKodProRIV
[C05726167F31]
n3:mistoKonaniAkce
Tsukuba
n3:mistoVydani
Piscataway
n3:nazevZdroje
Proceedings of the 21st International Conference on Pattern Recognition (ICPR2012)
n3:obor
n12:BD
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:projekt
n6:GAP103%2F11%2F0335 n6:GA102%2F08%2F0593
n3:rokUplatneniVysledku
n7:2012
n3:tvurceVysledku
Filip, Jiří
n3:typAkce
n21:WRD
n3:zahajeniAkce
2012-11-11+01:00
s:numberOfPages
4
n20:hasPublisher
IEEE Press
n13:isbn
978-1-4673-2216-4