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Statements

Subject Item
n2:RIV%2F67985556%3A_____%2F10%3A00346562%21RIV11-MSM-67985556
rdf:type
n8:Vysledek skos:Concept
dcterms:description
This paper describes a novel compound Markov random field model capable of realistic modelling of multispectral bidirectional texture function, which is currentl the most advanced representation of visual properties of surface materials. The proposed compound Markov random field model combines a non-parametric control random field with analytically solvable widesense Markov representation for single regions and thus allows to avoid demanding Markov Chain Monte Carlo methods for both parameters estimation and the compound random field synthesis. This paper describes a novel compound Markov random field model capable of realistic modelling of multispectral bidirectional texture function, which is currentl the most advanced representation of visual properties of surface materials. The proposed compound Markov random field model combines a non-parametric control random field with analytically solvable widesense Markov representation for single regions and thus allows to avoid demanding Markov Chain Monte Carlo methods for both parameters estimation and the compound random field synthesis.
dcterms:title
A Compound MRF Texture Model A Compound MRF Texture Model
skos:prefLabel
A Compound MRF Texture Model A Compound MRF Texture Model
skos:notation
RIV/67985556:_____/10:00346562!RIV11-MSM-67985556
n3:aktivita
n20:P n20:Z
n3:aktivity
P(1M0572), P(GA102/08/0593), Z(AV0Z10750506)
n3:dodaniDat
n7:2011
n3:domaciTvurceVysledku
n12:2890542 n12:9690875
n3:druhVysledku
n15:D
n3:duvernostUdaju
n4:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
244551
n3:idVysledku
RIV/67985556:_____/10:00346562
n3:jazykVysledku
n10:eng
n3:klicovaSlova
compound Markov random field; bidirectional texture function
n3:klicoveSlovo
n6:compound%20Markov%20random%20field n6:bidirectional%20texture%20function
n3:kontrolniKodProRIV
[431A5C0EF6A9]
n3:mistoKonaniAkce
Istanbul
n3:mistoVydani
Los Alamitos
n3:nazevZdroje
20th International Conference on Pattern Recognition
n3:obor
n9:BD
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n17:1M0572 n17:GA102%2F08%2F0593
n3:rokUplatneniVysledku
n7:2010
n3:tvurceVysledku
Havlíček, Vojtěch Haindl, Michal
n3:typAkce
n18:WRD
n3:zahajeniAkce
2010-08-23+02:00
n3:zamer
n16:AV0Z10750506
s:numberOfPages
4
n13:hasPublisher
IEEE Computer Society CPS
n14:isbn
978-1-4244-7542-1