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Statements

Subject Item
n2:RIV%2F61989592%3A15310%2F12%3A33140200%21RIV13-MSM-15310___
rdf:type
skos:Concept n10:Vysledek
dcterms:description
White-light interferometry is an established method for the measurement of the geometrical shape of objects. It can also be used for the measurement of the shape of objects with rough surfaces. Because of the rough surface, the phase of the white-light interferogram is not evaluated, the height information is obtained from the interferogram envelope. Hilbert transform is a classical method to calculate the envelope. In a real measurement, the interferogram is affected by the noise. We look for the answer to following questions: how does the noise of the calculated envelope look like? How does the noise influence the measurement uncertainty? White-light interferometry is an established method for the measurement of the geometrical shape of objects. It can also be used for the measurement of the shape of objects with rough surfaces. Because of the rough surface, the phase of the white-light interferogram is not evaluated, the height information is obtained from the interferogram envelope. Hilbert transform is a classical method to calculate the envelope. In a real measurement, the interferogram is affected by the noise. We look for the answer to following questions: how does the noise of the calculated envelope look like? How does the noise influence the measurement uncertainty?
dcterms:title
White-light interferometry - Envelope detection by Hilbert transform and influence of noise White-light interferometry - Envelope detection by Hilbert transform and influence of noise
skos:prefLabel
White-light interferometry - Envelope detection by Hilbert transform and influence of noise White-light interferometry - Envelope detection by Hilbert transform and influence of noise
skos:notation
RIV/61989592:15310/12:33140200!RIV13-MSM-15310___
n10:predkladatel
n12:orjk%3A15310
n3:aktivita
n18:P
n3:aktivity
P(ED2.1.00/03.0058), P(EE2.3.20.0017)
n3:cisloPeriodika
8
n3:dodaniDat
n11:2013
n3:domaciTvurceVysledku
n6:6341578 n6:1332333
n3:druhVysledku
n20:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n4:predkladatel
n3:idSjednocenehoVysledku
180937
n3:idVysledku
RIV/61989592:15310/12:33140200
n3:jazykVysledku
n19:eng
n3:klicovaSlova
Measurement uncertainty; Envelope detection; Noise; Hilbert transform; White-light interferometry
n3:klicoveSlovo
n8:White-light%20interferometry n8:Noise n8:Hilbert%20transform n8:Measurement%20uncertainty n8:Envelope%20detection
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[9355A67EB4CF]
n3:nazevZdroje
Optics and Lasers in Engineering
n3:obor
n17:BH
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n7:ED2.1.00%2F03.0058 n7:EE2.3.20.0017
n3:rokUplatneniVysledku
n11:2012
n3:svazekPeriodika
50
n3:tvurceVysledku
Michálek, Václav Pavlíček, Pavel
n3:wos
000304638200010
s:issn
0143-8166
s:numberOfPages
6
n15:doi
10.1016/j.optlaseng.2012.02.008
n16:organizacniJednotka
15310