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Namespace Prefixes

PrefixIRI
dctermshttp://purl.org/dc/terms/
n19http://purl.org/net/nknouf/ns/bibtex#
n16http://localhost/temp/predkladatel/
n20http://linked.opendata.cz/resource/domain/vavai/projekt/
n8http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n5http://linked.opendata.cz/resource/domain/vavai/subjekt/
n4http://linked.opendata.cz/ontology/domain/vavai/
n18https://schema.org/
shttp://schema.org/
n11http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F61989592%3A15110%2F12%3A33141168%21RIV13-MSM-15110___/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n21http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n17http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n12http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n13http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n7http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F61989592%3A15110%2F12%3A33141168%21RIV13-MSM-15110___
rdf:type
skos:Concept n4:Vysledek
dcterms:description
Atomic force microscopy (AFM) is a modern imaging technique that generates height representations of a sample surface with subnanometer resolution. Since 1986 it has evolved into a versatile tool which also provides maps of elastic and viscoelastic properties. Atomic force microscopy (AFM) is a modern imaging technique that generates height representations of a sample surface with subnanometer resolution. Since 1986 it has evolved into a versatile tool which also provides maps of elastic and viscoelastic properties.
dcterms:title
Atomic force microscopy : Studying mechanical properties of a cell Atomic force microscopy : Studying mechanical properties of a cell
skos:prefLabel
Atomic force microscopy : Studying mechanical properties of a cell Atomic force microscopy : Studying mechanical properties of a cell
skos:notation
RIV/61989592:15110/12:33141168!RIV13-MSM-15110___
n4:predkladatel
n5:orjk%3A15110
n3:aktivita
n17:S n17:P
n3:aktivity
P(ED0030/01/01), S
n3:dodaniDat
n7:2013
n3:domaciTvurceVysledku
n8:4906403 n8:7669135 n8:5342740 n8:2841215
n3:druhVysledku
n13:C
n3:duvernostUdaju
n21:S
n3:entitaPredkladatele
n11:predkladatel
n3:idSjednocenehoVysledku
124022
n3:idVysledku
RIV/61989592:15110/12:33141168
n3:jazykVysledku
n12:eng
n3:klicovaSlova
nanoindentation; stiffness tomography; Peak Force Tapping; adhesion; Young modulus; mechanical properties; atomic force microscopy
n3:klicoveSlovo
n9:Peak%20Force%20Tapping n9:mechanical%20properties n9:nanoindentation n9:Young%20modulus n9:adhesion n9:atomic%20force%20microscopy n9:stiffness%20tomography
n3:kontrolniKodProRIV
[355038FCDE66]
n3:mistoVydani
Badajoz
n3:nazevEdiceCisloSvazku
Microscopy book series number 5, Vol.1
n3:nazevZdroje
Current microscopy Contributions to Advances in Science and Technology
n3:obor
n15:BO
n3:pocetDomacichTvurcuVysledku
4
n3:pocetStranKnihy
788
n3:pocetTvurcuVysledku
4
n3:projekt
n20:ED0030%2F01%2F01
n3:rokUplatneniVysledku
n7:2012
n3:tvurceVysledku
Kolářová, Hana Malohlava, Jakub Zapletalová, Hana Tománková, Kateřina
s:numberOfPages
5
n19:hasPublisher
Formatex
n18:isbn
978-84-939843-5-9
n16:organizacniJednotka
15110