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Statements

Subject Item
n2:RIV%2F61989100%3A27360%2F11%3A86078670%21RIV12-MSM-27360___
rdf:type
n7:Vysledek skos:Concept
dcterms:description
A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances. A simple polarimetry configuration is used for measuring the thickness of a nonabsorbing thin film on an absorbing substrate from the ratio between the spectral reflectances.
dcterms:title
Spectral polarimetry-based measurement of the thickness of a thin film Spectral polarimetry-based measurement of the thickness of a thin film
skos:prefLabel
Spectral polarimetry-based measurement of the thickness of a thin film Spectral polarimetry-based measurement of the thickness of a thin film
skos:notation
RIV/61989100:27360/11:86078670!RIV12-MSM-27360___
n7:predkladatel
n8:orjk%3A27360
n3:aktivita
n22:Z n22:P
n3:aktivity
P(ED0040/01/01), Z(MSM6198910016)
n3:dodaniDat
n4:2012
n3:domaciTvurceVysledku
n18:7662114 n18:1171283 n18:4194128
n3:druhVysledku
n9:D
n3:duvernostUdaju
n17:S
n3:entitaPredkladatele
n5:predkladatel
n3:idSjednocenehoVysledku
231371
n3:idVysledku
RIV/61989100:27360/11:86078670
n3:jazykVysledku
n23:eng
n3:klicovaSlova
spectral polarimetry, reflectance ratio, thin film, thickness
n3:klicoveSlovo
n11:reflectance%20ratio n11:spectral%20polarimetry n11:thin%20film n11:thickness
n3:kontrolniKodProRIV
[EC6333C29F0F]
n3:mistoKonaniAkce
Mnichov
n3:mistoVydani
Bellingham
n3:nazevZdroje
Optical Measurement Systems for Industrial Inspection VII : 23-26 May 2011, Munich, Germany
n3:obor
n14:BH
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n15:ED0040%2F01%2F01
n3:rokUplatneniVysledku
n4:2011
n3:tvurceVysledku
Luňáček, Jiří Ciprian, Dalibor Hlubina, Petr
n3:typAkce
n19:WRD
n3:wos
000295076900098
n3:zahajeniAkce
2011-05-23+02:00
n3:zamer
n20:MSM6198910016
s:issn
0277-786X
s:numberOfPages
8
n21:hasPublisher
SPIE
n16:isbn
978-0-8194-8678-3
n12:organizacniJednotka
27360