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Statements

Subject Item
n2:RIV%2F61989100%3A27350%2F10%3A10224767%21RIV11-MSM-27350___
rdf:type
n9:Vysledek skos:Concept
dcterms:description
We present a new two-step white-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure. We present a new two-step white-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure.
dcterms:title
White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure
skos:prefLabel
White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure White-light spectral interferometric technique to measure a nonlinear phase function of a thin-film structure
skos:notation
RIV/61989100:27350/10:10224767!RIV11-MSM-27350___
n3:aktivita
n5:Z n5:P
n3:aktivity
P(ED0040/01/01), Z(MSM6198910016)
n3:cisloPeriodika
24
n3:dodaniDat
n7:2011
n3:domaciTvurceVysledku
n4:1171283 n4:7662114 n4:4194128
n3:druhVysledku
n16:J
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n15:predkladatel
n3:idSjednocenehoVysledku
298790
n3:idVysledku
RIV/61989100:27350/10:10224767
n3:jazykVysledku
n10:eng
n3:klicovaSlova
spectral interferometry, thin film, nonlinear phase function
n3:klicoveSlovo
n8:thin%20film n8:spectral%20interferometry n8:nonlinear%20phase%20function
n3:kodStatuVydavatele
NL - Nizozemsko
n3:kontrolniKodProRIV
[13557FA0D3B5]
n3:nazevZdroje
Optics Communications
n3:obor
n18:BH
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n13:ED0040%2F01%2F01
n3:rokUplatneniVysledku
n7:2010
n3:svazekPeriodika
283
n3:tvurceVysledku
Hlubina, Petr Luňáček, Jiří Ciprian, Dalibor
n3:wos
000284436500005
n3:zamer
n14:MSM6198910016
s:issn
0030-4018
s:numberOfPages
5
n11:organizacniJednotka
27350