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Statements

Subject Item
n2:RIV%2F61989100%3A27350%2F04%3A00011071%21RIV%2F2005%2FGA0%2F273505%2FN
rdf:type
skos:Concept n18:Vysledek
dcterms:description
Nové aspekty úzkopásmových optických filtrů pro DWDM Several aspects of thickness monitoring and turning-point prediction during deposition of the narrow band passoptical filters (NBPF) for dense-wavelength-division-multiplexing (DWDM) applications are discussed. Simpli-fication of the method using a recurrent approach, relative transmittance fitting is presented. Partial coherence,e#ects of monochromator bandpass and divergence of the testing incident beam are also included. We showthat the partial coherence effects in thin film structure are significant and can not be neglected. The proposedmethod is applicable for precise thickness monitoring and deposition control of any complex multilayer coating. Several aspects of thickness monitoring and turning-point prediction during deposition of the narrow band passoptical filters (NBPF) for dense-wavelength-division-multiplexing (DWDM) applications are discussed. Simpli-fication of the method using a recurrent approach, relative transmittance fitting is presented. Partial coherence,e#ects of monochromator bandpass and divergence of the testing incident beam are also included. We showthat the partial coherence effects in thin film structure are significant and can not be neglected. The proposedmethod is applicable for precise thickness monitoring and deposition control of any complex multilayer coating.
dcterms:title
New aspects of narrow band pass optical filters for DWDM Nové aspekty úzkopásmových optických filtrů pro DWDM New aspects of narrow band pass optical filters for DWDM
skos:prefLabel
New aspects of narrow band pass optical filters for DWDM Nové aspekty úzkopásmových optických filtrů pro DWDM New aspects of narrow band pass optical filters for DWDM
skos:notation
RIV/61989100:27350/04:00011071!RIV/2005/GA0/273505/N
n4:strany
77-82
n4:aktivita
n13:P
n4:aktivity
P(GA202/01/0077), P(ME 508)
n4:cisloPeriodika
5445
n4:dodaniDat
n9:2005
n4:domaciTvurceVysledku
n12:5882087 n12:1468391
n4:druhVysledku
n10:J
n4:duvernostUdaju
n7:S
n4:entitaPredkladatele
n17:predkladatel
n4:idSjednocenehoVysledku
576039
n4:idVysledku
RIV/61989100:27350/04:00011071
n4:jazykVysledku
n16:eng
n4:klicovaSlova
thin films;optical coating;bandpass filter;DWDM;partial coherence;monochromator bandpass
n4:klicoveSlovo
n11:optical%20coating n11:DWDM n11:bandpass%20filter n11:monochromator%20bandpass n11:partial%20coherence n11:thin%20films
n4:kodStatuVydavatele
US - Spojené státy americké
n4:kontrolniKodProRIV
[188B36B84091]
n4:nazevZdroje
Proceedings of SPIE
n4:obor
n14:BH
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
6
n4:projekt
n6:GA202%2F01%2F0077 n6:ME%20508
n4:rokUplatneniVysledku
n9:2004
n4:svazekPeriodika
Neuveden
n4:tvurceVysledku
Kikuchi, K. Endo, K. Kojima, M. Postava, Kamil Yamaguchi, T. Pištora, Jaromír
s:issn
0277-786X
s:numberOfPages
6
n15:organizacniJednotka
27350