This HTML5 document contains 47 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n20http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n19http://localhost/temp/predkladatel/
n11http://purl.org/net/nknouf/ns/bibtex#
n13http://linked.opendata.cz/resource/domain/vavai/projekt/
n6http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n16http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F61989100%3A27240%2F07%3A00017872%21RIV11-MSM-27240___/
n14http://linked.opendata.cz/ontology/domain/vavai/
n7https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n4http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n21http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n10http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F61989100%3A27240%2F07%3A00017872%21RIV11-MSM-27240___
rdf:type
n14:Vysledek skos:Concept
dcterms:description
The Power Quality Analyzer based on PC technology fully uses the advantages of virtual instrumentation approach. Its functionality is based on requirements of the latest power quality standards e.g. IEC 61000-4-30, 61000-4-7, 61000-4-15, EN 50160. The performance of today?s PCs allows comprehensive view to numerous of measured parameters. In comparison to the other available analyzers the full PC functionality is still available. This feature provides easy access to all common PC connectivity interfaces (HW&SW), data sharing and easy manipulation including the powerful data post processing. The Power Quality Analyzer based on PC technology fully uses the advantages of virtual instrumentation approach. Its functionality is based on requirements of the latest power quality standards e.g. IEC 61000-4-30, 61000-4-7, 61000-4-15, EN 50160. The performance of today?s PCs allows comprehensive view to numerous of measured parameters. In comparison to the other available analyzers the full PC functionality is still available. This feature provides easy access to all common PC connectivity interfaces (HW&SW), data sharing and easy manipulation including the powerful data post processing.
dcterms:title
Modular System for Distributed Power Quality Monitoring Modular System for Distributed Power Quality Monitoring
skos:prefLabel
Modular System for Distributed Power Quality Monitoring Modular System for Distributed Power Quality Monitoring
skos:notation
RIV/61989100:27240/07:00017872!RIV11-MSM-27240___
n3:aktivita
n21:P
n3:aktivity
P(1M0567)
n3:dodaniDat
n10:2011
n3:domaciTvurceVysledku
n6:6006108 n6:9084959
n3:druhVysledku
n8:D
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
434784
n3:idVysledku
RIV/61989100:27240/07:00017872
n3:jazykVysledku
n9:eng
n3:klicovaSlova
EDF; IEC 61000-4-15; IEC 61000-4-7; IEC 61000-4-30; EN50160; virtual instrumentation; power quality
n3:klicoveSlovo
n4:IEC%2061000-4-7 n4:virtual%20instrumentation n4:IEC%2061000-4-15 n4:power%20quality n4:EDF n4:EN50160 n4:IEC%2061000-4-30
n3:kontrolniKodProRIV
[DBF3DAD0BA4F]
n3:mistoKonaniAkce
Barcelona, SPAIN
n3:mistoVydani
NEW YORK
n3:nazevZdroje
PROCEEDINGS OF THE 9TH INTERNATIONAL CONFERENCE ON ELECTRICAL POWER QUALITY AND UTILISATION, VOLS 1 AND 2
n3:obor
n18:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
3
n3:projekt
n13:1M0567
n3:rokUplatneniVysledku
n10:2007
n3:tvurceVysledku
Hula, Jiří Bilík, Petr Koval, Ludvík
n3:typAkce
n20:WRD
n3:wos
000255859500140
n3:zahajeniAkce
2007-10-09+02:00
s:numberOfPages
5
n11:hasPublisher
IEEE, 345 E 47TH ST, NEW YORK, NY 10017 USA
n7:isbn
978-84-691-0057-8
n19:organizacniJednotka
27240