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Statements

Subject Item
n2:RIV%2F61389021%3A_____%2F14%3A00436704%21RIV15-GA0-61389021
rdf:type
skos:Concept n14:Vysledek
dcterms:description
In order to investigate plasma properties in the scrape-off layer, flush-mounted probes are frequently used in divertors or limiters. However, the presence of the magnetic field causes significant effects on the acquired I-V characteristics. This influence can be studied using Particle-in-Cell simulations. In this study, we use a cartesian 2D3V PIC code SPICE2 code to examine the dependencies of I-V characteristics on magnetic field grazing angle and magnitude and to relate them to known plasma parameters. Both flat and rounded probe tip geometry are investigated in the wide range of incident field line angles using the probe geometry based on the dedicated HFS limiter used on COMPASS tokamak. The I-V characteristics are analysed using a standard 3-parameter and 4-parameter procedures and the yielded values of Te and density are compared to input parameters. A semi-empirical rule for the slope of ion current is derived and can be used in analysis of experimental data. In order to investigate plasma properties in the scrape-off layer, flush-mounted probes are frequently used in divertors or limiters. However, the presence of the magnetic field causes significant effects on the acquired I-V characteristics. This influence can be studied using Particle-in-Cell simulations. In this study, we use a cartesian 2D3V PIC code SPICE2 code to examine the dependencies of I-V characteristics on magnetic field grazing angle and magnitude and to relate them to known plasma parameters. Both flat and rounded probe tip geometry are investigated in the wide range of incident field line angles using the probe geometry based on the dedicated HFS limiter used on COMPASS tokamak. The I-V characteristics are analysed using a standard 3-parameter and 4-parameter procedures and the yielded values of Te and density are compared to input parameters. A semi-empirical rule for the slope of ion current is derived and can be used in analysis of experimental data.
dcterms:title
Particle-in-cell Simulations of Flush-Mounted Probes Particle-in-cell Simulations of Flush-Mounted Probes
skos:prefLabel
Particle-in-cell Simulations of Flush-Mounted Probes Particle-in-cell Simulations of Flush-Mounted Probes
skos:notation
RIV/61389021:_____/14:00436704!RIV15-GA0-61389021
n3:aktivita
n11:P n11:I
n3:aktivity
I, P(GAP205/11/2341)
n3:dodaniDat
n5:2015
n3:domaciTvurceVysledku
n4:2769999 n4:4320964 n4:4881826 Dejarnac, Renaud
n3:druhVysledku
n17:D
n3:duvernostUdaju
n8:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
35834
n3:idVysledku
RIV/61389021:_____/14:00436704
n3:jazykVysledku
n15:eng
n3:klicovaSlova
Flush probe; I-V characteristics; simulation; Particle-in-cell
n3:klicoveSlovo
n10:Particle-in-cell n10:Flush%20probe n10:I-V%20characteristics n10:simulation
n3:kontrolniKodProRIV
[39B1E04A9F34]
n3:mistoKonaniAkce
Berlin
n3:mistoVydani
Mulhouse
n3:nazevZdroje
EPS2014:41st EPS Conference on Plasma Physics
n3:obor
n16:BL
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
5
n3:projekt
n20:GAP205%2F11%2F2341
n3:rokUplatneniVysledku
n5:2014
n3:tvurceVysledku
Gunn, J. P. Dejarnac, Renaud Pánek, Radomír Podolník, Aleš Komm, Michael
n3:typAkce
n18:EUR
n3:zahajeniAkce
2014-06-23+02:00
s:numberOfPages
4
n9:hasPublisher
European Physical Society
n12:isbn
2-914771-90-8