This HTML5 document contains 52 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n11http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n17http://purl.org/net/nknouf/ns/bibtex#
n8http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n5http://linked.opendata.cz/resource/domain/vavai/subjekt/
n4http://linked.opendata.cz/ontology/domain/vavai/
n13http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F61389021%3A_____%2F13%3A00422912%21RIV14-AV0-61389021/
n20https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n6http://linked.opendata.cz/ontology/domain/vavai/riv/
n21http://bibframe.org/vocab/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n10http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n16http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n19http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n14http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F61389021%3A_____%2F13%3A00422912%21RIV14-AV0-61389021
rdf:type
n4:Vysledek skos:Concept
dcterms:description
The paper presents the results of the studies into the effect exerted by neutron irradiation on the parameters of microcrystals of III-V group semiconductor materials (InSb, InAs and their solid solutions). The values of optimum initial charge carrier concentration for each of the materials under research, which would allow them to retain maximum radiation resistance, have been determined. The obtained results can be employed in assessing the industrial semiconductor sensors' operability in radiation environment. The paper presents the results of the studies into the effect exerted by neutron irradiation on the parameters of microcrystals of III-V group semiconductor materials (InSb, InAs and their solid solutions). The values of optimum initial charge carrier concentration for each of the materials under research, which would allow them to retain maximum radiation resistance, have been determined. The obtained results can be employed in assessing the industrial semiconductor sensors' operability in radiation environment.
dcterms:title
Effect of neutron irradiation on indium-containing III-V semiconductor micromonocrystals Effect of neutron irradiation on indium-containing III-V semiconductor micromonocrystals
skos:prefLabel
Effect of neutron irradiation on indium-containing III-V semiconductor micromonocrystals Effect of neutron irradiation on indium-containing III-V semiconductor micromonocrystals
skos:notation
RIV/61389021:_____/13:00422912!RIV14-AV0-61389021
n4:predkladatel
n5:ico%3A61389021
n6:aktivita
n15:I
n6:aktivity
I
n6:dodaniDat
n14:2014
n6:domaciTvurceVysledku
n8:5753902 n8:4566645
n6:druhVysledku
n18:D
n6:duvernostUdaju
n7:S
n6:entitaPredkladatele
n13:predkladatel
n6:idSjednocenehoVysledku
71636
n6:idVysledku
RIV/61389021:_____/13:00422912
n6:jazykVysledku
n16:eng
n6:klicovaSlova
plasma; tokamak; neutrons; micromonocrystals
n6:klicoveSlovo
n10:neutrons n10:micromonocrystals n10:plasma n10:tokamak
n6:kontrolniKodProRIV
[F109B602AEF6]
n6:mistoKonaniAkce
Budapest
n6:mistoVydani
STAFA-ZURICH
n6:nazevZdroje
MATERIALS AND APPLICATIONS FOR SENSORS AND TRANSDUCERS II Book Series: Key Engineering Materials
n6:obor
n19:BL
n6:pocetDomacichTvurcuVysledku
2
n6:pocetTvurcuVysledku
10
n6:rokUplatneniVysledku
n14:2013
n6:tvurceVysledku
Sentkerestiová, J. Makido, O. Bolshakova, I. Shurygin, F. Kovařík, Karel Ďuran, Ivan Shtabaliuk, A. Kost, Y. Viererbl, L. Kovaljova, N.
n6:typAkce
n11:WRD
n6:wos
000319023100067
n6:zahajeniAkce
2012-05-24+02:00
s:issn
1013-9826
s:numberOfPages
4
n21:doi
10.4028/www.scientific.net/KEM.543.273
n17:hasPublisher
TRANS TECH PUBLICATIONS LTD
n20:isbn
978-3-03785-616-1