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Statements

Subject Item
n2:RIV%2F61389005%3A_____%2F09%3A00329213%21RIV10-AV0-61389005
rdf:type
n13:Vysledek skos:Concept
dcterms:description
The peak profile shape analysis has been preferentially used in the evaluation of X-ray and synchrotron powder diffraction pattern. However, neutron diffraction facilities of new generation frequently offer the instrumental resolution high enough to efficiently study the effects of broadening of neutron diffraction profiles. The present paper describes the procedure for a detailed evaluation of Bragg peak shape based on the method of transformed model fitting (TMF) which has been recently developed particularly for the treatment of neutron diffraction profiles. Microstructure modeling is performed in the reciprocal space and the convolution of the model with the instrumental resolution curve is fitted to the profiles recorded in the diffraction experiment. The peak profile shape analysis has been preferentially used in the evaluation of X-ray and synchrotron powder diffraction pattern. However, neutron diffraction facilities of new generation frequently offer the instrumental resolution high enough to efficiently study the effects of broadening of neutron diffraction profiles. The present paper describes the procedure for a detailed evaluation of Bragg peak shape based on the method of transformed model fitting (TMF) which has been recently developed particularly for the treatment of neutron diffraction profiles. Microstructure modeling is performed in the reciprocal space and the convolution of the model with the instrumental resolution curve is fitted to the profiles recorded in the diffraction experiment.
dcterms:title
Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra
skos:prefLabel
Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra Evaluation of substructure parameters by peak profile analysis of high-resolution neutron diffraction spectra
skos:notation
RIV/61389005:_____/09:00329213!RIV10-AV0-61389005
n3:aktivita
n17:P n17:Z
n3:aktivity
P(IAA100480704), Z(AV0Z10480505), Z(MSM0021620834)
n3:cisloPeriodika
2
n3:dodaniDat
n5:2010
n3:domaciTvurceVysledku
n12:2458985 n12:4221028 n12:6994172
n3:druhVysledku
n14:J
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
313922
n3:idVysledku
RIV/61389005:_____/09:00329213
n3:jazykVysledku
n15:eng
n3:klicovaSlova
neutron diffraction; X-ray diffraction; profile analysis
n3:klicoveSlovo
n7:neutron%20diffraction n7:X-ray%20diffraction n7:profile%20analysis
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[BDA9A340FB19]
n3:nazevZdroje
Powder Diffraction
n3:obor
n6:BG
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
4
n3:projekt
n11:IAA100480704
n3:rokUplatneniVysledku
n5:2009
n3:svazekPeriodika
24
n3:tvurceVysledku
Kuzel, R. Lukáš, Petr Davydov, Vadim Strunz, Pavel
n3:wos
000267522500007
n3:zamer
n9:AV0Z10480505 n9:MSM0021620834
s:issn
0885-7156
s:numberOfPages
5