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Statements

Subject Item
n2:RIV%2F61389005%3A_____%2F05%3A00029221%21RIV06-AV0-61389005
rdf:type
n3:Vysledek skos:Concept
dcterms:description
Diffusion of Ag and Cu atoms in polyethyleneterephtalate (PET) and polyimide (PI) was studied using Rutherford backscattering spectroscopy (RBS) and elastic recoil detection analysis (ERDA). The samples were prepared by deposition of Ag and Cu thin layers on polymer surface using CVD and diode sputtering techniques. Samples were annealed at temperatures up to 240 degrees C. X-ray Photoelectron Spectroscopy (XPS) was used for determination of metal-polymer interaction and chemical state of atoms on metal-polymer interface. Faster diffusion of Ag atoms was observed from non-compact Ag layers prepared by diode sputtering than from those prepared by CVD technique. Ag atoms show higher mobility in PET in comparison with PI. XPS measurement gives an evidence of Ag clustering in Ag-PET samples prepared by cathode sputtering. In PI the Cu atoms exhibit higher diffusivity than Ag atoms due to their lower atomic radius. Difůze kovů Ag, Cu do PET a PI polymerů byla zkoumána s využitím jaderných analytických metod RBS a ERDA. Vzorky byly připravovány depozicí tenkých vrstev kovů na polymerních fóliích metodami diodového naprašování a napařováním. Vzorky byly žíhány na teploty blízké skleněnému přechodu polymeru. Metoda XPS byla použita pro studium vazeb polymeru a kovových atomů. Větší mobilita Ag částic byla pozorována s nesouvislých vrstev připravených diodovým naprašováním. XPS meření vykazuje přítomnost nadifundovaných kovových klastrů do polymeru v případě PET. Diffusion of Ag and Cu atoms in polyethyleneterephtalate (PET) and polyimide (PI) was studied using Rutherford backscattering spectroscopy (RBS) and elastic recoil detection analysis (ERDA). The samples were prepared by deposition of Ag and Cu thin layers on polymer surface using CVD and diode sputtering techniques. Samples were annealed at temperatures up to 240 degrees C. X-ray Photoelectron Spectroscopy (XPS) was used for determination of metal-polymer interaction and chemical state of atoms on metal-polymer interface. Faster diffusion of Ag atoms was observed from non-compact Ag layers prepared by diode sputtering than from those prepared by CVD technique. Ag atoms show higher mobility in PET in comparison with PI. XPS measurement gives an evidence of Ag clustering in Ag-PET samples prepared by cathode sputtering. In PI the Cu atoms exhibit higher diffusivity than Ag atoms due to their lower atomic radius.
dcterms:title
RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils RBS, ERDA a XPS studie difůze Ag a Cu do polymerních fólií PET a PI
skos:prefLabel
RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils RBS, ERDA a XPS studie difůze Ag a Cu do polymerních fólií PET a PI RBS, ERDA and XPS study of Ag and Cu diffusion in PET and PI polymer foils
skos:notation
RIV/61389005:_____/05:00029221!RIV06-AV0-61389005
n5:strany
303;307
n5:aktivita
n13:Z n13:P
n5:aktivity
P(GA102/03/0449), P(OC 527.100), Z(AV0Z10480505), Z(MSM6046137302)
n5:cisloPeriodika
1/2
n5:dodaniDat
n14:2006
n5:domaciTvurceVysledku
n8:5985498 n8:9699414
n5:druhVysledku
n15:J
n5:duvernostUdaju
n9:S
n5:entitaPredkladatele
n18:predkladatel
n5:idSjednocenehoVysledku
540070
n5:idVysledku
RIV/61389005:_____/05:00029221
n5:jazykVysledku
n17:eng
n5:klicovaSlova
metal diffusion; polymer metal intermixing; RBS
n5:klicoveSlovo
n7:RBS n7:metal%20diffusion n7:polymer%20metal%20intermixing
n5:kodStatuVydavatele
NL - Nizozemsko
n5:kontrolniKodProRIV
[722C02D123C7]
n5:nazevZdroje
Nuclear Instruments and Methods in Physical Research. B
n5:obor
n16:BM
n5:pocetDomacichTvurcuVysledku
2
n5:pocetTvurcuVysledku
4
n5:projekt
n6:GA102%2F03%2F0449 n6:OC%20527.100
n5:rokUplatneniVysledku
n14:2005
n5:svazekPeriodika
240
n5:tvurceVysledku
Peřina, Vratislav Švorčík, V. Zemek, Josef Macková, Anna
n5:zamer
n11:MSM6046137302 n11:AV0Z10480505
s:issn
0168-583X
s:numberOfPages
5