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Statements

Subject Item
n2:RIV%2F61389005%3A_____%2F02%3A49020069%21RIV%2F2003%2FGA0%2FA49003%2FN
rdf:type
n15:Vysledek skos:Concept
dcterms:description
Polymide-Kapton (PI) foils were implanted with 40 keV Fe.sup.+./sup. ions to a fluence of 0.25 x 10.sub.17./sup., 0,75 x 10.sub.17./sup. and 1.25 x 10.sub.17./sup. cm.sub.-2 ./sup. at ion current density of 4, 8 and 12 .mu.A cm.sub.-2./sup. The structure and composition of the modified PI were studied using Rutherford backscattering spectroscopy (RBS), proton-induced X-ray emission (PIXE) and transmission electron microscopy (TEM). A carbonaceous layer filled with up to 25 at. of agglomerated metal particles is formed under the sample surface. Anomalous depth profiles of the implanted metal atoms, consisting of a strong near-surface peak and two weaker ones under the implanted layer, are observed. Possible mechanisms of the metal redistribution after implantation are discussed. The depth profiles of the implanted metals are not influenced by increasing ion current density. Under thermal annealing at 300 .mult.C for 120 min, slow inward diffusion of Fe atoms is observed with diffusion coefficient 0,5-1 Polymide-Kapton (PI) foils were implanted with 40 keV Fe.sup.+./sup. ions to a fluence of 0.25 x 10.sub.17./sup., 0,75 x 10.sub.17./sup. and 1.25 x 10.sub.17./sup. cm.sub.-2 ./sup. at ion current density of 4, 8 and 12 .mu.A cm.sub.-2./sup. The structure and composition of the modified PI were studied using Rutherford backscattering spectroscopy (RBS), proton-induced X-ray emission (PIXE) and transmission electron microscopy (TEM). A carbonaceous layer filled with up to 25 at. of agglomerated metal particles is formed under the sample surface. Anomalous depth profiles of the implanted metal atoms, consisting of a strong near-surface peak and two weaker ones under the implanted layer, are observed. Possible mechanisms of the metal redistribution after implantation are discussed. The depth profiles of the implanted metals are not influenced by increasing ion current density. Under thermal annealing at 300 .mult.C for 120 min, slow inward diffusion of Fe atoms is observed with diffusion coefficient 0,5-1
dcterms:title
High-fluence implantation of iron into polyimide. High-fluence implantation of iron into polyimide.
skos:prefLabel
High-fluence implantation of iron into polyimide. High-fluence implantation of iron into polyimide.
skos:notation
RIV/61389005:_____/02:49020069!RIV/2003/GA0/A49003/N
n3:strany
395;398
n3:aktivita
n10:Z n10:P
n3:aktivity
P(GA102/01/1324), P(GA203/99/1626), Z(AV0Z1048901)
n3:cisloPeriodika
N/A
n3:dodaniDat
n8:2003
n3:domaciTvurceVysledku
n11:9699414 n11:8841152 n11:5985498
n3:druhVysledku
n13:J
n3:duvernostUdaju
n6:S
n3:entitaPredkladatele
n18:predkladatel
n3:idSjednocenehoVysledku
647582
n3:idVysledku
RIV/61389005:_____/02:49020069
n3:jazykVysledku
n16:eng
n3:klicovaSlova
polyimide; ion implantation; iron; Rutherford backscattering spectroscopy
n3:klicoveSlovo
n7:ion%20implantation n7:iron n7:polyimide n7:Rutherford%20backscattering%20spectroscopy
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[4ED949876923]
n3:nazevZdroje
Surface and Coatings Technology
n3:obor
n17:BG
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
7
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n5:GA203%2F99%2F1626 n5:GA102%2F01%2F1324
n3:rokUplatneniVysledku
n8:2002
n3:svazekPeriodika
158/159
n3:tvurceVysledku
Peřina, Vratislav Popok, V. N. Hnatowicz, Vladimír Macková, Anna Bazarov, V. V. Odzhaev, V. B. Khaibullin, R. I.
n3:zamer
n9:AV0Z1048901
s:issn
0257-8972
s:numberOfPages
4