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Statements

Subject Item
n2:RIV%2F61388980%3A_____%2F11%3A00375496%21RIV12-AV0-61388980
rdf:type
n14:Vysledek skos:Concept
dcterms:description
Non-invasive techniques utilizing X-ray radiation offer a significant advantage in scientific investigations of painted arts and other cultural artefacts such as painted artworks or statues. In addition, there is also great demand for a mobile analytical and real-time imaging device given the fact that many fine arts cannot be transported. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in the inner composition of a wide variety of objects. Moreover, it is able to map the surface distribution of the contained elements. Several transmission and emission techniques are presented which have been proposed and tested for the analysis of painted artworks. Non-invasive techniques utilizing X-ray radiation offer a significant advantage in scientific investigations of painted arts and other cultural artefacts such as painted artworks or statues. In addition, there is also great demand for a mobile analytical and real-time imaging device given the fact that many fine arts cannot be transported. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in the inner composition of a wide variety of objects. Moreover, it is able to map the surface distribution of the contained elements. Several transmission and emission techniques are presented which have been proposed and tested for the analysis of painted artworks.
dcterms:title
Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix
skos:prefLabel
Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix Analysis of painted arts by energy sensitive radiographic techniques with the Pixel Detector Timepix
skos:notation
RIV/61388980:_____/11:00375496!RIV12-AV0-61388980
n14:predkladatel
n18:ico%3A61388980
n3:aktivita
n9:P n9:Z
n3:aktivity
P(LC06041), Z(AV0Z40320502), Z(MSM6046144603), Z(MSM6840770040)
n3:cisloPeriodika
-
n3:dodaniDat
n17:2012
n3:domaciTvurceVysledku
n13:5758491
n3:druhVysledku
n4:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
185711
n3:idVysledku
RIV/61388980:_____/11:00375496
n3:jazykVysledku
n20:eng
n3:klicovaSlova
inspection with x-rays; pixelated detectors and associated VLSI electronics; X-ray fluorescence (XRF) systems; X-ray radiography and digital radiography (DR)
n3:klicoveSlovo
n12:inspection%20with%20x-rays n12:X-ray%20fluorescence%20%28XRF%29%20systems n12:X-ray%20radiography%20and%20digital%20radiography%20%28DR%29 n12:pixelated%20detectors%20and%20associated%20VLSI%20electronics
n3:kodStatuVydavatele
GB - Spojené království Velké Británie a Severního Irska
n3:kontrolniKodProRIV
[C06B999EAA28]
n3:nazevZdroje
Journal of Instrumentation
n3:obor
n15:CA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
6
n3:projekt
n19:LC06041
n3:rokUplatneniVysledku
n17:2011
n3:svazekPeriodika
6
n3:tvurceVysledku
Hradil, David Hradilová, J. Žemlička, J. Mislerová, H. Kroupa, M. Jakůbek, J.
n3:wos
000291345600071
n3:zamer
n11:AV0Z40320502 n11:MSM6840770040 n11:MSM6046144603
s:issn
1748-0221
s:numberOfPages
7
n5:doi
10.1088/1748-0221/6/01/C01066