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Statements

Subject Item
n2:RIV%2F60461373%3A22340%2F12%3A43893763%21RIV13-GA0-22340___
rdf:type
n11:Vysledek skos:Concept
dcterms:description
The paper reviews the problems of measurement of sheet resistance of ultrathin high-resistance lay-ers of organic semiconductors and the essential underlying problems. Particular attention is paid to potential influence of the resistance of contact regions on the results of direct measurement of sheet resistance of stripe-shaped layers. In this connection, we present a methodology of double length stripe resistance measurement (DLSRM), used above all to minimise the influence of contact regions on the measurement results. We deduce theoretical as well as practical possibilities of DLSRM in the diagnostics and quantitative characterisation of unsuitable or even faulty contacts on high-resistance layers. The application efficiency of the DLSRM method is documented by the results of sheet resistance measurement on zinc phthalocyanine with cathode sputtered planar contacts of noble metals (gold, platinum, or palladium). As expected, gold is the best contact material, but even in its application one cannot neglect the influence of contact regions. The presented method is universal and generally applicable to all materials where sheet resistance is the elevant parameter, and its assessment is based on measurements of the layer resistance in stripe arrangement. The paper reviews the problems of measurement of sheet resistance of ultrathin high-resistance lay-ers of organic semiconductors and the essential underlying problems. Particular attention is paid to potential influence of the resistance of contact regions on the results of direct measurement of sheet resistance of stripe-shaped layers. In this connection, we present a methodology of double length stripe resistance measurement (DLSRM), used above all to minimise the influence of contact regions on the measurement results. We deduce theoretical as well as practical possibilities of DLSRM in the diagnostics and quantitative characterisation of unsuitable or even faulty contacts on high-resistance layers. The application efficiency of the DLSRM method is documented by the results of sheet resistance measurement on zinc phthalocyanine with cathode sputtered planar contacts of noble metals (gold, platinum, or palladium). As expected, gold is the best contact material, but even in its application one cannot neglect the influence of contact regions. The presented method is universal and generally applicable to all materials where sheet resistance is the elevant parameter, and its assessment is based on measurements of the layer resistance in stripe arrangement.
dcterms:title
Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials
skos:prefLabel
Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials Methodology of evaluating the influence of the resistance of contact regions in the measurement of sheet resistance on stripes of ultrathin high-resistance materials
skos:notation
RIV/60461373:22340/12:43893763!RIV13-GA0-22340___
n11:predkladatel
n12:orjk%3A22340
n3:aktivita
n4:S n4:P n4:Z
n3:aktivity
P(GAP108/11/1298), S, Z(MSM6046137302)
n3:cisloPeriodika
3.7.2012
n3:dodaniDat
n6:2013
n3:domaciTvurceVysledku
n19:9315918
n3:druhVysledku
n8:J
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n20:predkladatel
n3:idSjednocenehoVysledku
149753
n3:idVysledku
RIV/60461373:22340/12:43893763
n3:jazykVysledku
n21:eng
n3:klicovaSlova
materials; high-resistance; ultrathin; stripes; resistance; sheet; measurement; the; regions; contact; influence; evaluating; Methodology
n3:klicoveSlovo
n7:measurement n7:ultrathin n7:the n7:evaluating n7:high-resistance n7:influence n7:regions n7:stripes n7:sheet n7:materials n7:Methodology n7:resistance n7:contact
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[B243A7A2510D]
n3:nazevZdroje
REVIEW OF SCIENTIFIC INSTRUMENTS
n3:obor
n18:JB
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
3
n3:projekt
n16:GAP108%2F11%2F1298
n3:rokUplatneniVysledku
n6:2012
n3:svazekPeriodika
83
n3:tvurceVysledku
Kašpárková, Irena Fitl, Přemysl Náhlík, Josef
n3:wos
000307527900043
n3:zamer
n17:MSM6046137302
s:issn
0034-6748
s:numberOfPages
10
n14:doi
10.1063/1.4731654
n15:organizacniJednotka
22340