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Statements

Subject Item
n2:RIV%2F60076658%3A12640%2F09%3A00010075%21RIV10-MSM-12640___
rdf:type
skos:Concept n9:Vysledek
dcterms:description
Electron beam induced second harmonic generation (SHG) is studied in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles with concentrations that are controlled by the heat-treatment of the samples. The SHG is observed at T = 4.2 K using a p-polarized laser beam at 1064 nm. Enhancement of the SHG is observed in the samples that are submitted to electron beam incidence. The highest value of the nonlinear susceptibility, 2.08 pm/V, is achieved for the sample heat-treated during 72 h and submitted to an electron beam current of 15 nA. The samples that were not exposed to the electron beam present a susceptibility of a parts per thousand 0.5 pm/V. Electron beam induced second harmonic generation (SHG) is studied in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles with concentrations that are controlled by the heat-treatment of the samples. The SHG is observed at T = 4.2 K using a p-polarized laser beam at 1064 nm. Enhancement of the SHG is observed in the samples that are submitted to electron beam incidence. The highest value of the nonlinear susceptibility, 2.08 pm/V, is achieved for the sample heat-treated during 72 h and submitted to an electron beam current of 15 nA. The samples that were not exposed to the electron beam present a susceptibility of a parts per thousand 0.5 pm/V.
dcterms:title
Electron beam induced second-harmonic generation in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles Electron beam induced second-harmonic generation in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles
skos:prefLabel
Electron beam induced second-harmonic generation in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles Electron beam induced second-harmonic generation in Er3+ doped PbO-GeO2 glasses containing silver nanoparticles
skos:notation
RIV/60076658:12640/09:00010075!RIV10-MSM-12640___
n4:aktivita
n13:Z
n4:aktivity
Z(MSM6007665808)
n4:cisloPeriodika
1
n4:dodaniDat
n5:2010
n4:domaciTvurceVysledku
Reshak, Ali Hussain
n4:druhVysledku
n16:J
n4:duvernostUdaju
n14:S
n4:entitaPredkladatele
n10:predkladatel
n4:idSjednocenehoVysledku
312849
n4:idVysledku
RIV/60076658:12640/09:00010075
n4:jazykVysledku
n6:eng
n4:klicovaSlova
ENHANCEMENT; IRRADIATION
n4:klicoveSlovo
n12:IRRADIATION n12:ENHANCEMENT
n4:kodStatuVydavatele
NL - Nizozemsko
n4:kontrolniKodProRIV
[6EA4198A9AFC]
n4:nazevZdroje
Journal of Materials Science-Materials in Electronics
n4:obor
n15:BO
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
6
n4:rokUplatneniVysledku
n5:2009
n4:svazekPeriodika
20
n4:tvurceVysledku
Reshak, Ali Hussain Miedzinski, R. Kityk, I. V. Kassab, LRP. Ebothe, J. da Silva, D. M.
n4:wos
000261970500013
n4:zamer
n7:MSM6007665808
s:issn
0957-4522
s:numberOfPages
5
n17:organizacniJednotka
12640