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Statements

Subject Item
n2:RIV%2F49777513%3A23640%2F12%3A43917411%21RIV13-MSM-23640___
rdf:type
n5:Vysledek skos:Concept
dcterms:description
Microcrystalline silicon is very important material for silicon based thin-film solar cells. It is especially convenient for tandem silicon solar cells using a-Si:H/?c-Si:H double- or triple-junction technology. Because the ?c-Si:H is a composition of amorphous and crystalline phases, its physical properties are strongly influenced by the volume content of the crystalline phase and by the hydrogen content in the films. Experimental diffraction and spectral lines are the convolution of various functions arising from the instrumental factors and specimen imperfections. The films were investigated by X-ray diffraction, Raman and FTIR spectroscopies using the line profile analysis. Real structure parameters of the films (crystalline volume content, micro-strains, grain sizes, hydrogen content and distribution) carried out from the analysis indicated good agreement between the results from UV/Vis spectrophotometry Microcrystalline silicon is very important material for silicon based thin-film solar cells. It is especially convenient for tandem silicon solar cells using a-Si:H/?c-Si:H double- or triple-junction technology. Because the ?c-Si:H is a composition of amorphous and crystalline phases, its physical properties are strongly influenced by the volume content of the crystalline phase and by the hydrogen content in the films. Experimental diffraction and spectral lines are the convolution of various functions arising from the instrumental factors and specimen imperfections. The films were investigated by X-ray diffraction, Raman and FTIR spectroscopies using the line profile analysis. Real structure parameters of the films (crystalline volume content, micro-strains, grain sizes, hydrogen content and distribution) carried out from the analysis indicated good agreement between the results from UV/Vis spectrophotometry
dcterms:title
Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies
skos:prefLabel
Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies Microstructure Determination of mc-Si:H Films Analysing the Breadths of Diffraction and Spectral Lines of XRD, FTIR and Raman Spectroscopies
skos:notation
RIV/49777513:23640/12:43917411!RIV13-MSM-23640___
n5:predkladatel
n18:orjk%3A23640
n3:aktivita
n15:P
n3:aktivity
P(ED2.1.00/03.0088)
n3:dodaniDat
n4:2013
n3:domaciTvurceVysledku
n6:1889788 n6:1072595 n6:6890075 n6:8498989
n3:druhVysledku
n12:O
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
150428
n3:idVysledku
RIV/49777513:23640/12:43917411
n3:jazykVysledku
n16:eng
n3:klicovaSlova
microstructure; a-Si:H, ?c-Si:H, optical properties
n3:klicoveSlovo
n8:a-Si%3AH n8:%3Fc-Si%3AH n8:microstructure n8:optical%20properties
n3:kontrolniKodProRIV
[DEF5E6D36A9C]
n3:obor
n11:BM
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
5
n3:projekt
n7:ED2.1.00%2F03.0088
n3:rokUplatneniVysledku
n4:2012
n3:tvurceVysledku
Šutta, Pavol Netrvalová, Marie Müllerová, Jarmila Calta, Pavel Prušáková, Lucie
n13:organizacniJednotka
23640