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Statements

Subject Item
n2:RIV%2F49777513%3A23220%2F12%3A43916349%21RIV13-MSM-23220___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
The current predominate photovoltaic (abbr PV) technology is based on the crystalline silicon (c-Si). Unfortunately the PV cells created by the c-Si have few disadvantages. Therefore, the researchers worldwide are developing an alternative material in effort to improve the PV cells performances. The thin-film materials offer promising alternative to the c-Si technology. The thin films are base of the PV 2nd and 3rd generation. The properties of these cells are very largely determined by properties of the thin-film materials. For this reason, it is absolutely necessary to deal with their detection. This paper is concerned with some of the experimental methods used in the research and development of the thin-film generation and with some results of this research. The first part is very shortly introduction to problematic of the thin-film PV cells. The second part of paper discusses one of specific experimental methods, with which we can meet in research and development of PV cells 2nd and 3rd generation - X-Ray diffraction. The last part presents some results from this method. The current predominate photovoltaic (abbr PV) technology is based on the crystalline silicon (c-Si). Unfortunately the PV cells created by the c-Si have few disadvantages. Therefore, the researchers worldwide are developing an alternative material in effort to improve the PV cells performances. The thin-film materials offer promising alternative to the c-Si technology. The thin films are base of the PV 2nd and 3rd generation. The properties of these cells are very largely determined by properties of the thin-film materials. For this reason, it is absolutely necessary to deal with their detection. This paper is concerned with some of the experimental methods used in the research and development of the thin-film generation and with some results of this research. The first part is very shortly introduction to problematic of the thin-film PV cells. The second part of paper discusses one of specific experimental methods, with which we can meet in research and development of PV cells 2nd and 3rd generation - X-Ray diffraction. The last part presents some results from this method.
dcterms:title
Research of Thin Films Used in PV Cells 2nd and 3rd Generation Research of Thin Films Used in PV Cells 2nd and 3rd Generation
skos:prefLabel
Research of Thin Films Used in PV Cells 2nd and 3rd Generation Research of Thin Films Used in PV Cells 2nd and 3rd Generation
skos:notation
RIV/49777513:23220/12:43916349!RIV13-MSM-23220___
n18:predkladatel
n19:orjk%3A23220
n3:aktivita
n12:S
n3:aktivity
S
n3:dodaniDat
n11:2013
n3:domaciTvurceVysledku
n16:1949535 n16:4525566
n3:druhVysledku
n15:C
n3:duvernostUdaju
n6:S
n3:entitaPredkladatele
n20:predkladatel
n3:idSjednocenehoVysledku
165148
n3:idVysledku
RIV/49777513:23220/12:43916349
n3:jazykVysledku
n17:eng
n3:klicovaSlova
Thin film, photovoltaic cell, X-Ray diffraction, diffractogram, spectroscopy
n3:klicoveSlovo
n4:Thin%20film n4:diffractogram n4:X-Ray%20diffraction n4:photovoltaic%20cell n4:spectroscopy
n3:kontrolniKodProRIV
[9A74357E4CBB]
n3:mistoVydani
Praha
n3:nazevEdiceCisloSvazku
Neuveden
n3:nazevZdroje
Electric Power Engineering and Ecology - Selected Parts III.
n3:obor
n5:JE
n3:pocetDomacichTvurcuVysledku
2
n3:pocetStranKnihy
96
n3:pocetTvurcuVysledku
2
n3:rokUplatneniVysledku
n11:2012
n3:tvurceVysledku
Škorpil, Jan Benešová, Hana
s:numberOfPages
6
n14:hasPublisher
BEN - technická literatura
n7:isbn
978-80-7300-460-6
n13:organizacniJednotka
23220