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Statements

Subject Item
n2:RIV%2F46747885%3A24620%2F14%3A%230000510%21RIV15-MSM-24620___
rdf:type
n6:Vysledek skos:Concept
dcterms:description
The Usage of Backscattered Electrons in Scanning Electron Microscopy. The Usage of Backscattered Electrons in Scanning Electron Microscopy.
dcterms:title
The Usage of Backscattered Electrons in Scanning Electron Microscopy The Usage of Backscattered Electrons in Scanning Electron Microscopy
skos:prefLabel
The Usage of Backscattered Electrons in Scanning Electron Microscopy The Usage of Backscattered Electrons in Scanning Electron Microscopy
skos:notation
RIV/46747885:24620/14:#0000510!RIV15-MSM-24620___
n3:aktivita
n15:P
n3:aktivity
P(LO1201)
n3:cisloPeriodika
3
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n4:2015
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n3:duvernostUdaju
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n3:entitaPredkladatele
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n3:idSjednocenehoVysledku
52207
n3:idVysledku
RIV/46747885:24620/14:#0000510
n3:jazykVysledku
n12:eng
n3:klicovaSlova
SEM; BSE; Structure
n3:klicoveSlovo
n9:Structure n9:SEM n9:BSE
n3:kodStatuVydavatele
CZ - Česká republika
n3:kontrolniKodProRIV
[0AC2A5A5B027]
n3:nazevZdroje
Manufacturing technology
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1
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3
n3:projekt
n14:LO1201
n3:rokUplatneniVysledku
n4:2014
n3:svazekPeriodika
14
n3:tvurceVysledku
Kejzlar, Pavel Macajová, Eva Švec, Martin
s:issn
1213-2489
s:numberOfPages
4
n5:organizacniJednotka
24620