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Statements

Subject Item
n2:RIV%2F46747885%3A24510%2F09%3A%230000149%21RIV11-GA0-24510___
rdf:type
skos:Concept n12:Vysledek
dcterms:description
The paper is focused to the nonlinear electromechanical properties of piezoelectric thin films subjected to the high electric field. The influence of the electric filed on the piezoelectric body is presented by the change of the elastic and piezoelectric modules. Experimentally, the zinc oxide (ZnO) thin film samples of (002)-orientation were prepared by RF magnetron sputtering the Pt/Ti/SiO2/Si substrates. The thin film samples were investigated under high electric field excitations and corresponding strains. The nonlinear electromechanical properties of the ZnO thin films were investigated by original double beam laser interferometer at room temperature. The results are discussed and compared with already published data. The paper is focused to the nonlinear electromechanical properties of piezoelectric thin films subjected to the high electric field. The influence of the electric filed on the piezoelectric body is presented by the change of the elastic and piezoelectric modules. Experimentally, the zinc oxide (ZnO) thin film samples of (002)-orientation were prepared by RF magnetron sputtering the Pt/Ti/SiO2/Si substrates. The thin film samples were investigated under high electric field excitations and corresponding strains. The nonlinear electromechanical properties of the ZnO thin films were investigated by original double beam laser interferometer at room temperature. The results are discussed and compared with already published data.
dcterms:title
Nonlinear Properties of the ZnO Thin Films and Their Experimentally Verification by Laser Interferometry Nonlinear Properties of the ZnO Thin Films and Their Experimentally Verification by Laser Interferometry
skos:prefLabel
Nonlinear Properties of the ZnO Thin Films and Their Experimentally Verification by Laser Interferometry Nonlinear Properties of the ZnO Thin Films and Their Experimentally Verification by Laser Interferometry
skos:notation
RIV/46747885:24510/09:#0000149!RIV11-GA0-24510___
n3:aktivita
n10:P
n3:aktivity
P(GA202/07/1289)
n3:cisloPeriodika
5
n3:dodaniDat
n9:2011
n3:domaciTvurceVysledku
n17:1305786
n3:druhVysledku
n11:J
n3:duvernostUdaju
n14:S
n3:entitaPredkladatele
n7:predkladatel
n3:idSjednocenehoVysledku
329719
n3:idVysledku
RIV/46747885:24510/09:#0000149
n3:jazykVysledku
n4:eng
n3:klicovaSlova
ZnO thin films Si substrate RF sputtering electromechanical non-linear properties
n3:klicoveSlovo
n18:ZnO%20thin%20films%20Si%20substrate%20RF%20sputtering%20electromechanical%20non-linear%20properties
n3:kodStatuVydavatele
NL - Nizozemsko
n3:kontrolniKodProRIV
[8BDCD3C50B76]
n3:nazevZdroje
FERROELECTRICS
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
4
n3:projekt
n15:GA202%2F07%2F1289
n3:rokUplatneniVysledku
n9:2009
n3:svazekPeriodika
389
n3:tvurceVysledku
Nosek, Jaroslav Šulc, Miroslav Burianová, Lidmila Radoberský, Tomáš
n3:wos
270809300011
s:issn
0015-0193
s:numberOfPages
12
n16:organizacniJednotka
24510