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Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F13%3A%230002859%21RIV14-MSM-24220___
rdf:type
n16:Vysledek skos:Concept
rdfs:seeAlso
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6645584&isnumber=6645482
dcterms:description
This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies. This paper presents a method and results from measurement of internal parameters of Xilinx XC7Z020 Zynq device - the programmable microelectronic nanostructures designed on 28 nm TSMC's technology. The presented method utilizes undersampling approach and a very easy way of processing of BRAM data streams. The presented flexible circuits have been used in various measurements of timing parameters delays in FPGAs, up to measurements or detection of the aging issues. The paper presents surprising overview of such measurements with the key result, that the usability of the latest 28 nm devices under accelerated conditions is strictly limited to lower frequencies or significantly lower temperatures. It also significantly limits the possibility of study of aging effects under accelerated conditions and might affect security applications. The paper extends the measurements and results available from previous technology nodes and tries to uncover new information and areas of the latest high-end technologies.
dcterms:title
On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.
skos:prefLabel
On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions. On Measurement of Parameters of Programmable Microelectronic Nanostructures Under Accelerating Extreme Conditions.
skos:notation
RIV/46747885:24220/13:#0002859!RIV14-MSM-24220___
n16:predkladatel
n17:orjk%3A24220
n3:aktivita
n23:S n23:P
n3:aktivity
P(LD13019), S
n3:dodaniDat
n18:2014
n3:domaciTvurceVysledku
n12:7390742 n12:8619158
n3:druhVysledku
n21:D
n3:duvernostUdaju
n5:S
n3:entitaPredkladatele
n9:predkladatel
n3:idSjednocenehoVysledku
93745
n3:idVysledku
RIV/46747885:24220/13:#0002859
n3:jazykVysledku
n15:eng
n3:klicovaSlova
aging
n3:klicoveSlovo
n14:aging
n3:kontrolniKodProRIV
[05C45D31A5A3]
n3:mistoKonaniAkce
Porto, Portugal
n3:mistoVydani
Porto, Portugal
n3:nazevZdroje
In:23rd International Conference on Field Programmable Logic and Applications (FPL'13)
n3:obor
n4:JC
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n11:LD13019
n3:rokUplatneniVysledku
n18:2013
n3:tvurceVysledku
Plíva, Zdeněk Pfeifer, Petr
n3:typAkce
n19:WRD
n3:zahajeniAkce
2013-01-01+01:00
s:numberOfPages
4
n22:doi
10.1109/FPL.2013.6645584
n7:hasPublisher
IEEE
n6:isbn
978-1-4799-0004-6
n10:organizacniJednotka
24220