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Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F08%3A%230001333%21RIV10-AV0-24220___
rdf:type
n8:Vysledek skos:Concept
dcterms:description
This paper describes new compression method that is used for test pattern compaction and compression in algorithm called COMPAS, which utilizes a test data compression method based on pattern overlapping. This algorithm reorders and compresses deterministic test patterns previously generated in an ATPG by overlapping them. Independency of COMPAS on used ATPG is discussed and verified. New method improves compression ratio by preprocessing input data to determine the degree of random test resistance for each fault. This information allows the algorithm to reorder test patterns more efficiently and results to 10% compression ratio improvement in average. Compressed data sequence is well suited for decompression by the scan chains in the embedded tester cores. This paper describes new compression method that is used for test pattern compaction and compression in algorithm called COMPAS, which utilizes a test data compression method based on pattern overlapping. This algorithm reorders and compresses deterministic test patterns previously generated in an ATPG by overlapping them. Independency of COMPAS on used ATPG is discussed and verified. New method improves compression ratio by preprocessing input data to determine the degree of random test resistance for each fault. This information allows the algorithm to reorder test patterns more efficiently and results to 10% compression ratio improvement in average. Compressed data sequence is well suited for decompression by the scan chains in the embedded tester cores.
dcterms:title
Efficient Tas Pattern Compression Method Using Hard Fault Preferring Efficient Tas Pattern Compression Method Using Hard Fault Preferring
skos:prefLabel
Efficient Tas Pattern Compression Method Using Hard Fault Preferring Efficient Tas Pattern Compression Method Using Hard Fault Preferring
skos:notation
RIV/46747885:24220/08:#0001333!RIV10-AV0-24220___
n4:aktivita
n21:P
n4:aktivity
P(1QS108040510)
n4:dodaniDat
n10:2010
n4:domaciTvurceVysledku
n19:5144795
n4:druhVysledku
n12:D
n4:duvernostUdaju
n13:S
n4:entitaPredkladatele
n9:predkladatel
n4:idSjednocenehoVysledku
365508
n4:idVysledku
RIV/46747885:24220/08:#0001333
n4:jazykVysledku
n14:eng
n4:klicovaSlova
off-line IC testing; test pattern compression
n4:klicoveSlovo
n5:off-line%20IC%20testing n5:test%20pattern%20compression
n4:kontrolniKodProRIV
[B73369525EC4]
n4:mistoKonaniAkce
Parma, Italy
n4:nazevZdroje
EUROMICRO DSD 2008
n4:obor
n15:JC
n4:pocetDomacichTvurcuVysledku
1
n4:pocetTvurcuVysledku
1
n4:projekt
n16:1QS108040510
n4:rokUplatneniVysledku
n10:2008
n4:tvurceVysledku
Jeníček, Jiří
n4:typAkce
n6:WRD
n4:wos
000264279400094
n4:zahajeniAkce
2008-01-01+01:00
s:numberOfPages
6
n18:hasPublisher
IEEE COMPUTER SOC
n11:isbn
978-0-7695-3277-6
n17:organizacniJednotka
24220