This HTML5 document contains 46 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n18http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n19http://localhost/temp/predkladatel/
n5http://purl.org/net/nknouf/ns/bibtex#
n10http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n6http://linked.opendata.cz/resource/domain/vavai/projekt/
n14http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F46747885%3A24220%2F05%3A00000136%21RIV06-GA0-24220___/
n12http://linked.opendata.cz/ontology/domain/vavai/
n11https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n8http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n17http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n21http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n7http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F05%3A00000136%21RIV06-GA0-24220___
rdf:type
skos:Concept n12:Vysledek
dcterms:description
Článek představuje kompaktní metodu s kombinací kompresní techniky, která připravuje komprimované testovací vzorky pro RESPIN architekturu. RESPIN architektura je kompatibilní se standardem IEEE 1500. The test pattern compaction method combined with test input data compression technique for the RESPIN architecture is presented. RESPIN architecture is compatible with the IEEE 1500 standard and can be implemented in complex SoCs. The test pattern compaction method combined with test input data compression technique for the RESPIN architecture is presented. RESPIN architecture is compatible with the IEEE 1500 standard and can be implemented in complex SoCs.
dcterms:title
Test Pattern Compression for Circuits with the RESPIN Architecture Komprese testovacích vzorků pro obvody s RESPIN architekturou Test Pattern Compression for Circuits with the RESPIN Architecture
skos:prefLabel
Komprese testovacích vzorků pro obvody s RESPIN architekturou Test Pattern Compression for Circuits with the RESPIN Architecture Test Pattern Compression for Circuits with the RESPIN Architecture
skos:notation
RIV/46747885:24220/05:00000136!RIV06-GA0-24220___
n3:strany
141-146
n3:aktivita
n17:P
n3:aktivity
P(GA102/04/2137)
n3:dodaniDat
n7:2006
n3:domaciTvurceVysledku
n10:5372240 n10:9570748
n3:druhVysledku
n4:D
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n14:predkladatel
n3:idSjednocenehoVysledku
546462
n3:idVysledku
RIV/46747885:24220/05:00000136
n3:jazykVysledku
n20:eng
n3:klicovaSlova
COMPAS; RESPIN; Scan Chain; Testability
n3:klicoveSlovo
n8:Testability n8:COMPAS n8:Scan%20Chain n8:RESPIN
n3:kontrolniKodProRIV
[13B3CCF10B13]
n3:mistoKonaniAkce
Tallinn, Estonia
n3:mistoVydani
Tallinn, Estonia
n3:nazevZdroje
Informal Digest of Papers of the 10th IEEE European Test Symposium
n3:obor
n21:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n6:GA102%2F04%2F2137
n3:rokUplatneniVysledku
n7:2005
n3:tvurceVysledku
Novák, Ondřej Zahrádka, Jiří
n3:typAkce
n18:WRD
n3:zahajeniAkce
2005-05-22+02:00
s:numberOfPages
6
n5:hasPublisher
Neuveden
n11:isbn
83-919289-9-3
n19:organizacniJednotka
24220