This HTML5 document contains 41 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n15http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n21http://purl.org/net/nknouf/ns/bibtex#
n7http://localhost/temp/predkladatel/
n13http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n6http://linked.opendata.cz/resource/domain/vavai/projekt/
n17http://linked.opendata.cz/ontology/domain/vavai/
n12http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F46747885%3A24220%2F05%3A%230001346%21RIV10-GA0-24220___/
n18https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n4http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n19http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n5http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F05%3A%230001346%21RIV10-GA0-24220___
rdf:type
skos:Concept n17:Vysledek
dcterms:description
This paper presents a software tool for test pattern compaction combined with compression of the test patterns to further reduce test data volume and time requirement. Usually the test set compaction is performed independently on test compression. We have implemented a test compaction and compression scheme that reorders test patterns previously generated in an ATPG in such a way that they are well suited for decompression. The compressed test sequence is decompressed in a scan chain. No design changes are required to be done in the functional part of the circuit. The tool is called COMPAS and it finds a sequence of overlapping patterns; each pattern detects a maximum number of circuit faults. This paper presents a software tool for test pattern compaction combined with compression of the test patterns to further reduce test data volume and time requirement. Usually the test set compaction is performed independently on test compression. We have implemented a test compaction and compression scheme that reorders test patterns previously generated in an ATPG in such a way that they are well suited for decompression. The compressed test sequence is decompressed in a scan chain. No design changes are required to be done in the functional part of the circuit. The tool is called COMPAS and it finds a sequence of overlapping patterns; each pattern detects a maximum number of circuit faults.
dcterms:title
COMPAS - Compressed test pattern sequencer for scan based circuits COMPAS - Compressed test pattern sequencer for scan based circuits
skos:prefLabel
COMPAS - Compressed test pattern sequencer for scan based circuits COMPAS - Compressed test pattern sequencer for scan based circuits
skos:notation
RIV/46747885:24220/05:#0001346!RIV10-GA0-24220___
n3:aktivita
n14:P
n3:aktivity
P(1QS108040510), P(GA102/04/2137)
n3:dodaniDat
n5:2010
n3:domaciTvurceVysledku
n13:9570748 n13:7390742
n3:druhVysledku
n16:D
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
515963
n3:idVysledku
RIV/46747885:24220/05:#0001346
n3:jazykVysledku
n20:eng
n3:klicovaSlova
Scan Chain
n3:klicoveSlovo
n4:Scan%20Chain
n3:kontrolniKodProRIV
[16F4E23FEAA6]
n3:mistoKonaniAkce
Budapest, HUNGARY
n3:mistoVydani
Budapest, HUNGARY
n3:nazevZdroje
DEPENDABLE COMPUTING - EDCC-5, PROCEEDINGS
n3:obor
n19:JC
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
3
n3:projekt
n6:1QS108040510 n6:GA102%2F04%2F2137
n3:rokUplatneniVysledku
n5:2005
n3:tvurceVysledku
Novák, Ondřej Plíva, Zdeněk
n3:typAkce
n15:WRD
n3:zahajeniAkce
2005-01-01+01:00
s:issn
0302-9743
s:numberOfPages
12
n21:hasPublisher
SPRINGER-VERLAG BERLIN
n18:isbn
3-540-25723-3
n7:organizacniJednotka
24220