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Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F01%3A00000009%21RIV%2F2002%2FMSM%2F242202%2FN
rdf:type
n16:Vysledek skos:Concept
dcterms:description
In this paper we present experiences with BISTE (Built-In Self Test Equipment) from hardware point-of-view. Circuit scheme consists of the CUT (Circuit Under Test), TPG (Test Pattern Generator - part of the BIST which prepares test patterns and forces itAll these parts have an influence on the dimensions of the final IC. Different test techniques have different hardware overhead demands. We have done the comparison of the basic flip-flops (FF), which we have used for the TPG design. We also demonstrate an influence of the used BISTE technique to the hardware overhead. In this paper we present experiences with BISTE (Built-In Self Test Equipment) from hardware point-of-view. Circuit scheme consists of the CUT (Circuit Under Test), TPG (Test Pattern Generator - part of the BIST which prepares test patterns and forces itAll these parts have an influence on the dimensions of the final IC. Different test techniques have different hardware overhead demands. We have done the comparison of the basic flip-flops (FF), which we have used for the TPG design. We also demonstrate an influence of the used BISTE technique to the hardware overhead.
dcterms:title
Built-In Self Test From Hardware Point of View Built-In Self Test From Hardware Point of View
skos:prefLabel
Built-In Self Test From Hardware Point of View Built-In Self Test From Hardware Point of View
skos:notation
RIV/46747885:24220/01:00000009!RIV/2002/MSM/242202/N
n3:strany
131-135
n3:aktivita
n18:Z n18:P
n3:aktivity
P(GA102/01/0566), Z(MSM 242200002)
n3:dodaniDat
n19:2002
n3:domaciTvurceVysledku
n8:9570748 n8:7390742
n3:druhVysledku
n11:D
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n21:predkladatel
n3:idSjednocenehoVysledku
674772
n3:idVysledku
RIV/46747885:24220/01:00000009
n3:jazykVysledku
n12:eng
n3:klicovaSlova
%22Hardware overhead; BIST%22
n3:klicoveSlovo
n7:%2522Hardware%20overhead n7:BIST%2522
n3:kontrolniKodProRIV
[52202AD0C932]
n3:mistoKonaniAkce
Toulouse
n3:mistoVydani
Toulouse, France
n3:nazevZdroje
5th Workshop on Electronics, Control, Modelling, Measurment and Signals
n3:obor
n13:JA
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:projekt
n6:GA102%2F01%2F0566
n3:rokUplatneniVysledku
n19:2001
n3:tvurceVysledku
Novák, Ondřej Plíva, Zdeněk
n3:typAkce
n5:WRD
n3:zahajeniAkce
2001-05-30+02:00
n3:zamer
n4:MSM%20242200002
s:numberOfPages
5
n14:hasPublisher
Universite Paul Sabatier
n17:organizacniJednotka
24220