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Statements

Subject Item
n2:RIV%2F46747885%3A24220%2F00%3A00000030%21RIV%2F2001%2FMSM%2F242201%2FN
rdf:type
skos:Concept n11:Vysledek
dcterms:description
An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain An Efficient Deterministic test Pattern Compaction Scheme Using Modified IC Scan Chain
dcterms:title
On Using Deterministic Test Sets in BIST On Using Deterministic Test Sets in BIST
skos:prefLabel
On Using Deterministic Test Sets in BIST On Using Deterministic Test Sets in BIST
skos:notation
RIV/46747885:24220/00:00000030!RIV/2001/MSM/242201/N
n3:strany
127
n3:aktivita
n6:Z n6:P
n3:aktivity
P(VS96006), Z(MSM 242200002)
n3:dodaniDat
n5:2001
n3:domaciTvurceVysledku
Novák, Ondrej
n3:druhVysledku
n17:D
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n20:predkladatel
n3:idSjednocenehoVysledku
720516
n3:idVysledku
RIV/46747885:24220/00:00000030
n3:jazykVysledku
n16:eng
n3:klicovaSlova
IC design
n3:klicoveSlovo
n4:IC%20design
n3:kontrolniKodProRIV
[BA732C902808]
n3:mistoVydani
Palma de Mallorca, Spain
n3:nazevZdroje
Proc. of 6th IEEE International On-Line Testing Workshop,
n3:obor
n19:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n18:VS96006
n3:rokUplatneniVysledku
n5:2000
n3:tvurceVysledku
Novák, Ondrej
n3:zamer
n8:MSM%20242200002
s:numberOfPages
5
n10:hasPublisher
IEEE
n14:isbn
0-7695-064
n12:organizacniJednotka
24220