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Statements

Subject Item
n2:RIV%2F44555601%3A13430%2F04%3A00002542%21RIV%2F2005%2FMSM%2F134305%2FN
rdf:type
n7:Vysledek skos:Concept
dcterms:description
A computer experiment for the study of relations between morphological and electrical properties of metalydielectric composite films was prepared. The complete experiment consists of three parts - simulation of composite structures, morphological analysis and transport analysis. In the present contribution the first part is discussed in detail. Byl pripraven pocitacovy experiment pro studium vztahu morfologickych a elektrickych vlastnosti kompozitnich filmu slozenych z kovove a dielektricke faze. Experiment se sklada ze tri casti - simulace kompozitni struktury, morfologicka analyza a transportni analyza. Tento prispevek pojednava o casti prvni. A computer experiment for the study of relations between morphological and electrical properties of metalydielectric composite films was prepared. The complete experiment consists of three parts - simulation of composite structures, morphological analysis and transport analysis. In the present contribution the first part is discussed in detail.
dcterms:title
Electrical and morphological properties of composite films near the percolation threshold: models of composite structures Elektrické a morfologické vlastnosti kompozitních vrstev v blízkosti perkolačního prahu: modely kompozitnich struktur Electrical and morphological properties of composite films near the percolation threshold: models of composite structures
skos:prefLabel
Electrical and morphological properties of composite films near the percolation threshold: models of composite structures Electrical and morphological properties of composite films near the percolation threshold: models of composite structures Elektrické a morfologické vlastnosti kompozitních vrstev v blízkosti perkolačního prahu: modely kompozitnich struktur
skos:notation
RIV/44555601:13430/04:00002542!RIV/2005/MSM/134305/N
n4:strany
174-177
n4:aktivita
n12:Z n12:P
n4:aktivity
P(1K04115), Z(MSM 113200002)
n4:cisloPeriodika
1-2
n4:dodaniDat
n9:2005
n4:domaciTvurceVysledku
n5:4128710 n5:7033222 n5:9042989 n5:9380434
n4:druhVysledku
n18:J
n4:duvernostUdaju
n11:S
n4:entitaPredkladatele
n13:predkladatel
n4:idSjednocenehoVysledku
562478
n4:idVysledku
RIV/44555601:13430/04:00002542
n4:jazykVysledku
n19:eng
n4:klicovaSlova
Modelling;Morphological analysis;Electrical properties
n4:klicoveSlovo
n10:Modelling n10:Morphological%20analysis n10:Electrical%20properties
n4:kodStatuVydavatele
NL - Nizozemsko
n4:kontrolniKodProRIV
[3EF8DF7B0241]
n4:nazevZdroje
Thin Solid Films
n4:obor
n15:BL
n4:pocetDomacichTvurcuVysledku
4
n4:pocetTvurcuVysledku
4
n4:projekt
n14:1K04115
n4:rokUplatneniVysledku
n9:2004
n4:svazekPeriodika
459
n4:tvurceVysledku
Novák, Stanislav Švec, Martin Sedlák, Dalibor Hrach, Rudolf
n4:zamer
n16:MSM%20113200002
s:issn
0040-6090
s:numberOfPages
4
n17:organizacniJednotka
13430