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Statements

Subject Item
n2:RIV%2F44555601%3A13430%2F03%3A00002357%21RIV%2F2004%2FMSM%2F134304%2FN
rdf:type
skos:Concept n14:Vysledek
dcterms:description
The basic ideas of computer experiment for the study of connections between electrical and morphological characteristics of composite films of the structure metal-dielectric are given. The complete system of models will consist of three parts: the simulation of composite structure, its morphological analysis and the analysis of transport properties of simulated structure, followed by the analysis both of results of simulation and comparison with experimental data. As the total computer experiment is toolarge, in this contribution only its first part is presented, while the other parts are only briefly described and will be published next time. In the contribution five models both for the simulation of three-dimensional and two-dimensional structures w ere suggested and results of simulation compared both from the point of view of probable physical correctness and of computational effectiveness. The basic ideas of computer experiment for the study of connections between electrical and morphological characteristics of composite films of the structure metal-dielectric are given. The complete system of models will consist of three parts: the simulation of composite structure, its morphological analysis and the analysis of transport properties of simulated structure, followed by the analysis both of results of simulation and comparison with experimental data. As the total computer experiment is toolarge, in this contribution only its first part is presented, while the other parts are only briefly described and will be published next time. In the contribution five models both for the simulation of three-dimensional and two-dimensional structures w ere suggested and results of simulation compared both from the point of view of probable physical correctness and of computational effectiveness.
dcterms:title
Study of electrical properties of thin metal films and composite films near the percolation threshold I Study of electrical properties of thin metal films and composite films near the percolation threshold I
skos:prefLabel
Study of electrical properties of thin metal films and composite films near the percolation threshold I Study of electrical properties of thin metal films and composite films near the percolation threshold I
skos:notation
RIV/44555601:13430/03:00002357!RIV/2004/MSM/134304/N
n3:strany
635-640
n3:aktivita
n8:Z
n3:aktivity
Z(MSM 113200002), Z(MSM 134300001)
n3:dodaniDat
n9:2004
n3:domaciTvurceVysledku
n16:4128710 n16:7033222
n3:druhVysledku
n18:D
n3:duvernostUdaju
n11:S
n3:entitaPredkladatele
n4:predkladatel
n3:idSjednocenehoVysledku
629545
n3:idVysledku
RIV/44555601:13430/03:00002357
n3:jazykVysledku
n20:eng
n3:klicovaSlova
Composite films, Modelling, Morphological analysis, Electrical properties
n3:klicoveSlovo
n12:Composite%20films n12:Morphological%20analysis n12:Modelling n12:Electrical%20properties
n3:kontrolniKodProRIV
[F6652DE12153]
n3:mistoKonaniAkce
Praha
n3:mistoVydani
Praha
n3:nazevZdroje
Proceedings of Contribute Papers of WDS´03
n3:obor
n13:BM
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:pocetUcastnikuAkce
0
n3:pocetZahranicnichUcastnikuAkce
0
n3:rokUplatneniVysledku
n9:2003
n3:tvurceVysledku
Hrach, Rudolf Švec, Martin
n3:typAkce
n21:EUR
n3:zahajeniAkce
2003-06-10+02:00
n3:zamer
n5:MSM%20113200002 n5:MSM%20134300001
s:numberOfPages
6
n19:hasPublisher
Univerzita Karlova v Praze. Matematicko-fyzikální fakulta
n17:isbn
80-86732-18-5
n6:organizacniJednotka
13430