This HTML5 document contains 42 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n10http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F26821532%3A_____%2F13%3A%230000056%21RIV13-MPO-26821532/
dctermshttp://purl.org/dc/terms/
n16http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n6http://linked.opendata.cz/resource/domain/vavai/projekt/
n18http://linked.opendata.cz/resource/domain/vavai/subjekt/
n17http://linked.opendata.cz/ontology/domain/vavai/
n11http://linked.opendata.cz/ontology/domain/vavai/riv/podDruhVysledku/
n5http://linked.opendata.cz/ontology/domain/vavai/riv/
skoshttp://www.w3.org/2004/02/skos/core#
n14http://linked.opendata.cz/ontology/domain/vavai/riv/licencniPoplatek/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n20http://linked.opendata.cz/ontology/domain/vavai/riv/kategorie/
n12http://linked.opendata.cz/ontology/domain/vavai/riv/vyuzitiJinymSubjektem/
n9http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n15http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n19http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n7http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n13http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F26821532%3A_____%2F13%3A%230000056%21RIV13-MPO-26821532
rdf:type
skos:Concept n17:Vysledek
dcterms:description
Polished Silicon wafer with crystallographic orientation <110>. Wafer diameter 150 mm, Czochralski growth method, On-orientation, <110> 0.0° ± 0.5°, slightly boron doped, flatness <1 um GTIR, total thickness variation < 1 um, bow and warp < 20 um. Polished Silicon wafer with crystallographic orientation <110>. Wafer diameter 150 mm, Czochralski growth method, On-orientation, <110> 0.0° ± 0.5°, slightly boron doped, flatness <1 um GTIR, total thickness variation < 1 um, bow and warp < 20 um.
dcterms:title
Final Product Specification for FRTI3031 <110> 625 µm or 525 µm Polished Wafers Final Product Specification for FRTI3031 <110> 625 µm or 525 µm Polished Wafers
skos:prefLabel
Final Product Specification for FRTI3031 <110> 625 µm or 525 µm Polished Wafers Final Product Specification for FRTI3031 <110> 625 µm or 525 µm Polished Wafers
skos:notation
RIV/26821532:_____/13:#0000056!RIV13-MPO-26821532
n17:predkladatel
n18:ico%3A26821532
n5:aktivita
n19:P
n5:aktivity
P(FR-TI3/031)
n5:dodaniDat
n13:2013
n5:domaciTvurceVysledku
n16:1388428 n16:6724264
n5:druhVysledku
n11:G%2FB
n5:duvernostUdaju
n15:C
n5:ekonomickeParametry
Cena: MAX. 30 USD/Si wafer.
n5:entitaPredkladatele
n10:predkladatel
n5:idSjednocenehoVysledku
75018
n5:idVysledku
RIV/26821532:_____/13:#0000056
n5:interniIdentifikace
FRTI3031 <110>
n5:jazykVysledku
n8:eng
n5:kategorie
n20:A
n5:klicovaSlova
Silicon wafer; Silicon crystal; Czochralski growth; MEMS; Polished wafer
n5:klicoveSlovo
n9:Czochralski%20growth n9:Silicon%20wafer n9:Silicon%20crystal n9:Polished%20wafer n9:MEMS
n5:kontrolniKodProRIV
[02E6F19D6D0A]
n5:licencniPoplatek
n14:A
n5:obor
n7:JJ
n5:pocetDomacichTvurcuVysledku
2
n5:pocetTvurcuVysledku
2
n5:projekt
n6:FR-TI3%2F031
n5:rokUplatneniVysledku
n13:2013
n5:technickeParametry
CZ Si, 150 mm, <110> 0.0° ± 0.5°, flat 47.5 mm On <1-11> ± 0.3°, flatness <1 um GTIR, total thickness variation < 1 um, bow and warp < 20 um, Oi 26.0 – 36.0 ppma, R 0.3 - 1.0 ohmcm.
n5:tvurceVysledku
Šik, Jan Válek, Lukáš
n5:vlastnik
n10:vlastnikVysledku
n5:vyuzitiJinymSubjektem
n12:A