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Namespace Prefixes

PrefixIRI
n21http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n13http://purl.org/net/nknouf/ns/bibtex#
n3http://localhost/temp/predkladatel/
n5http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n15http://linked.opendata.cz/ontology/domain/vavai/
n19http://linked.opendata.cz/resource/domain/vavai/zamer/
n7https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n4http://linked.opendata.cz/ontology/domain/vavai/riv/
n17http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26230%2F02%3APU36201%21RIV%2F2003%2FMSM%2F262303%2FN/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n10http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n14http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n16http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n8http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n20http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n12http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26230%2F02%3APU36201%21RIV%2F2003%2FMSM%2F262303%2FN
rdf:type
skos:Concept n15:Vysledek
dcterms:description
The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented. The paper deals with a design overview of special-property factors for testability valuation of a digital circuit at RT level. The reasons for development of such factors and a way of their utilization are presented in this paper. Then, mathematical formulas are used to demonstrate these factors in a formal way and finally experimental results are presented.
dcterms:title
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
skos:prefLabel
Normalized Testability Measures at RT Level: Utilization and Reasons for Creation Normalized Testability Measures at RT Level: Utilization and Reasons for Creation
skos:notation
RIV/00216305:26230/02:PU36201!RIV/2003/MSM/262303/N
n4:strany
297-304
n4:aktivita
n16:Z
n4:aktivity
Z(MSM 262200012)
n4:dodaniDat
n12:2003
n4:domaciTvurceVysledku
n5:7825668 n5:8821968
n4:druhVysledku
n20:D
n4:duvernostUdaju
n14:S
n4:entitaPredkladatele
n17:predkladatel
n4:idSjednocenehoVysledku
655831
n4:idVysledku
RIV/00216305:26230/02:PU36201
n4:jazykVysledku
n8:eng
n4:klicovaSlova
Register-transfer level, controllability, observability, testability, testability analysis
n4:klicoveSlovo
n10:observability n10:testability n10:controllability n10:Register-transfer%20level n10:testability%20analysis
n4:kontrolniKodProRIV
[DA54988D3707]
n4:mistoKonaniAkce
Rožnov pod Radhoštěm
n4:mistoVydani
Ostrava
n4:nazevZdroje
Proceedings of 36th International Conference MOSIS`02 Modeling and Simulation of Systems
n4:obor
n18:JC
n4:pocetDomacichTvurcuVysledku
2
n4:pocetTvurcuVysledku
2
n4:pocetUcastnikuAkce
0
n4:pocetZahranicnichUcastnikuAkce
0
n4:rokUplatneniVysledku
n12:2002
n4:tvurceVysledku
Strnadel, Josef Kotásek, Zdeněk
n4:typAkce
n21:WRD
n4:zahajeniAkce
2002-04-22+02:00
n4:zamer
n19:MSM%20262200012
s:numberOfPages
8
n13:hasPublisher
Neuveden
n7:isbn
80-85988-71-2
n3:organizacniJednotka
26230