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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F14%3APU109180%21RIV15-MSM-26220___
rdf:type
n13:Vysledek skos:Concept
dcterms:description
The performance and lifetime of solar cells critically depends on bulk and surface defects. To improve performance of solar cells, localization and characterization of defects on the microscale is an important issue. This paper describes a variety of microstructural defects in crystalline silicon solar cells which appear during the cell processing steps. The set of defects have been investigated and localized using visible light emission under reversed bias voltage. A light beam induced photocurrent method allows localization of defects having impact on the sample current-voltage plot and reversed bias light emission characteristics. These are shown together with the micrographs of defective surface areas. As a result, particular defects which induce nonlinearity and local breakdown in the current-voltage plot were identified in tested solar cell structures. Furthermore, measurements at various temperatures allows to identify the breakdown mechanism of the investigated defects. An interest The performance and lifetime of solar cells critically depends on bulk and surface defects. To improve performance of solar cells, localization and characterization of defects on the microscale is an important issue. This paper describes a variety of microstructural defects in crystalline silicon solar cells which appear during the cell processing steps. The set of defects have been investigated and localized using visible light emission under reversed bias voltage. A light beam induced photocurrent method allows localization of defects having impact on the sample current-voltage plot and reversed bias light emission characteristics. These are shown together with the micrographs of defective surface areas. As a result, particular defects which induce nonlinearity and local breakdown in the current-voltage plot were identified in tested solar cell structures. Furthermore, measurements at various temperatures allows to identify the breakdown mechanism of the investigated defects. An interest
dcterms:title
A variety of microstructural defects in crystalline silicon solar cells A variety of microstructural defects in crystalline silicon solar cells
skos:prefLabel
A variety of microstructural defects in crystalline silicon solar cells A variety of microstructural defects in crystalline silicon solar cells
skos:notation
RIV/00216305:26220/14:PU109180!RIV15-MSM-26220___
n4:aktivita
n18:S n18:P
n4:aktivity
P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), P(LH11060), S
n4:cisloPeriodika
312
n4:dodaniDat
n19:2015
n4:domaciTvurceVysledku
n6:4931637 n6:6493645 n6:2967677 Dallaeva, Dinara n6:3673332 n6:3502465 n6:2108585 n6:3684539
n4:druhVysledku
n17:J
n4:duvernostUdaju
n5:S
n4:entitaPredkladatele
n12:predkladatel
n4:idSjednocenehoVysledku
1270
n4:idVysledku
RIV/00216305:26220/14:PU109180
n4:jazykVysledku
n14:eng
n4:klicovaSlova
Solar cell, silicon, microstructure defect, light emission, reverse bias, measurement
n4:klicoveSlovo
n9:measurement n9:silicon n9:Solar%20cell n9:reverse%20bias n9:light%20emission n9:microstructure%20defect
n4:kodStatuVydavatele
NL - Nizozemsko
n4:kontrolniKodProRIV
[F0639A5C93D0]
n4:nazevZdroje
Applied Surface Science
n4:obor
n16:JA
n4:pocetDomacichTvurcuVysledku
8
n4:pocetTvurcuVysledku
9
n4:projekt
n15:LH11060 n15:ED1.1.00%2F02.0068 n15:ED2.1.00%2F03.0072
n4:rokUplatneniVysledku
n19:2014
n4:svazekPeriodika
312
n4:tvurceVysledku
Koktavý, Pavel Smith, Steve J. Škarvada, Pavel Dallaeva, Dinara Vondra, Marek Grmela, Lubomír Šicner, Jiří Tománek, Pavel Macků, Robert
s:issn
0169-4332
s:numberOfPages
7
n3:doi
10.1016/j.apsusc.2014.05.064
n11:organizacniJednotka
26220