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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F13%3APU105342%21RIV14-GA0-26220___
rdf:type
skos:Concept n16:Vysledek
dcterms:description
Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations as well as by de Monocrystalline silicon wafer is up-to-date most used material for the fabrication of solar cells. The recent investigation shows that the quality of cells is often degraded by structural defects emerging during processing steps. Hence the paper gives first an overview of solar cell efficiency investigation on macroscale. Then a detection and microscale localization of tiny local defects in solar cell structures which evidently affect electrical and photoelectrical properties of the cells is targeted. The local defects can be classified as microfractures, precipitates and other material structure inhomogeneities. Detection and localization of the defects in the structure and the assigning of particular defects to corresponding degradation of photoelectrical parameters are key points for solar cell lifetime and efficiency improvement. Although the breakdown can be evident in current-voltage plot, the localization of defects on the sample has to be provided by microscopic investigations as well as by de
dcterms:title
Optical and electrical detection and localization of solar cell defects on microscale Optical and electrical detection and localization of solar cell defects on microscale
skos:prefLabel
Optical and electrical detection and localization of solar cell defects on microscale Optical and electrical detection and localization of solar cell defects on microscale
skos:notation
RIV/00216305:26220/13:PU105342!RIV14-GA0-26220___
n16:predkladatel
n17:orjk%3A26220
n3:aktivita
n14:P
n3:aktivity
P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), P(GAP102/11/0995)
n3:cisloPeriodika
8825
n3:dodaniDat
n19:2014
n3:domaciTvurceVysledku
n6:3673332 n6:2108585 Dallaeva, Dinara Prokopyeva, Elena n6:2967677 n6:6493645
n3:druhVysledku
n4:J
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n10:predkladatel
n3:idSjednocenehoVysledku
94214
n3:idVysledku
RIV/00216305:26220/13:PU105342
n3:jazykVysledku
n20:eng
n3:klicovaSlova
solar cell, silicon, monocrystalline, defect, localization, detection, efficiency
n3:klicoveSlovo
n8:efficiency n8:detection n8:monocrystalline n8:silicon n8:defect n8:solar%20cell n8:localization
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[A4ED3EF32E50]
n3:nazevZdroje
Proceedings of SPIE
n3:obor
n9:JA
n3:pocetDomacichTvurcuVysledku
6
n3:pocetTvurcuVysledku
7
n3:projekt
n13:ED2.1.00%2F03.0072 n13:GAP102%2F11%2F0995 n13:ED1.1.00%2F02.0068
n3:rokUplatneniVysledku
n19:2013
n3:svazekPeriodika
8825
n3:tvurceVysledku
Škarvada, Pavel Prokopyeva, Elena Tománek, Pavel Macků, Robert Smith, Steve J. Grmela, Lubomír Dallaeva, Dinara
s:issn
0277-786X
s:numberOfPages
8
n5:doi
10.1117/12.2023265
n15:organizacniJednotka
26220