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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F13%3APU103073%21RIV14-GA0-26220___
rdf:type
n9:Vysledek skos:Concept
dcterms:description
Monocrystalline silicon is still very interesting material for solar cells fabrication due to its quality and external efficiency. Nevertheless during a tailoring of eligible silicon wafers, some inhomogeneities or irregularities emerge and provide defects which give trouble to good operation of solar panels. Generally, there are two classes of defects in silicon wafer-Material defects due to imperfections or irregularity in crystal structure (point, line, square or volume defects), and defects induced by wafer processing. To avoid a use of damaged cells, macroscopic and microscopic measurement techniques must be applied. In this paper we present a microscopic method combining electrical noise measurements with scanning probe localization of luminous micro-spots defects. The paper brings experimental results showing local electric and optical investigations of defects in etched monocrystalline silicon solar cells and a use of cold field emission tungsten electrode as a local probe for apertureless sc Monocrystalline silicon is still very interesting material for solar cells fabrication due to its quality and external efficiency. Nevertheless during a tailoring of eligible silicon wafers, some inhomogeneities or irregularities emerge and provide defects which give trouble to good operation of solar panels. Generally, there are two classes of defects in silicon wafer-Material defects due to imperfections or irregularity in crystal structure (point, line, square or volume defects), and defects induced by wafer processing. To avoid a use of damaged cells, macroscopic and microscopic measurement techniques must be applied. In this paper we present a microscopic method combining electrical noise measurements with scanning probe localization of luminous micro-spots defects. The paper brings experimental results showing local electric and optical investigations of defects in etched monocrystalline silicon solar cells and a use of cold field emission tungsten electrode as a local probe for apertureless sc
dcterms:title
Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells
skos:prefLabel
Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells Cold field emission electrode as a local probe of proximal microscopes-Investigation of defects in monocrystalline silicon solar cells
skos:notation
RIV/00216305:26220/13:PU103073!RIV14-GA0-26220___
n9:predkladatel
n16:orjk%3A26220
n3:aktivita
n14:P
n3:aktivity
P(ED1.1.00/02.0068), P(ED2.1.00/03.0072), P(GAP102/11/0995)
n3:cisloPeriodika
2
n3:dodaniDat
n7:2014
n3:domaciTvurceVysledku
Dallaeva, Dinara n12:3673332 n12:6493645 n12:2967677 n12:2108585
n3:druhVysledku
n15:J
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n19:predkladatel
n3:idSjednocenehoVysledku
65897
n3:idVysledku
RIV/00216305:26220/13:PU103073
n3:jazykVysledku
n17:eng
n3:klicovaSlova
Silicon solar cell, Defect, Near-field optically induced photocurrent, Scanning near-field optical microscopy, Cold-field emission electrode
n3:klicoveSlovo
n6:Near-field%20optically%20induced%20photocurrent n6:Silicon%20solar%20cell n6:Scanning%20near-field%20optical%20microscopy n6:Defect n6:Cold-field%20emission%20electrode
n3:kodStatuVydavatele
CN - Čínská lidová republika
n3:kontrolniKodProRIV
[FE211F572C00]
n3:nazevZdroje
WORLD JOURNAL OF ENGINEERING
n3:obor
n5:JA
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
6
n3:projekt
n11:ED2.1.00%2F03.0072 n11:ED1.1.00%2F02.0068 n11:GAP102%2F11%2F0995
n3:rokUplatneniVysledku
n7:2013
n3:svazekPeriodika
10
n3:tvurceVysledku
Tománek, Pavel Grmela, Lubomír Škarvada, Pavel Smith, Steve J. Dallaeva, Dinara Macků, Robert
s:issn
1708-5284
s:numberOfPages
6
n18:organizacniJednotka
26220