This HTML5 document contains 47 embedded RDF statements represented using HTML+Microdata notation.

The embedded RDF content will be recognized by any processor of HTML5 Microdata.

Namespace Prefixes

PrefixIRI
n20http://linked.opendata.cz/ontology/domain/vavai/riv/typAkce/
dctermshttp://purl.org/dc/terms/
n11http://localhost/temp/predkladatel/
n6http://purl.org/net/nknouf/ns/bibtex#
n10http://linked.opendata.cz/resource/domain/vavai/riv/tvurce/
n5http://linked.opendata.cz/resource/domain/vavai/projekt/
n15http://linked.opendata.cz/resource/domain/vavai/subjekt/
n14http://linked.opendata.cz/ontology/domain/vavai/
n7https://schema.org/
shttp://schema.org/
skoshttp://www.w3.org/2004/02/skos/core#
n3http://linked.opendata.cz/ontology/domain/vavai/riv/
n2http://linked.opendata.cz/resource/domain/vavai/vysledek/
rdfhttp://www.w3.org/1999/02/22-rdf-syntax-ns#
n17http://linked.opendata.cz/resource/domain/vavai/vysledek/RIV%2F00216305%3A26220%2F12%3APU101179%21RIV13-MPO-26220___/
n12http://linked.opendata.cz/ontology/domain/vavai/riv/klicoveSlovo/
n22http://linked.opendata.cz/ontology/domain/vavai/riv/duvernostUdaju/
xsdhhttp://www.w3.org/2001/XMLSchema#
n21http://linked.opendata.cz/ontology/domain/vavai/riv/aktivita/
n16http://linked.opendata.cz/ontology/domain/vavai/riv/jazykVysledku/
n18http://linked.opendata.cz/ontology/domain/vavai/riv/druhVysledku/
n4http://linked.opendata.cz/ontology/domain/vavai/riv/obor/
n9http://reference.data.gov.uk/id/gregorian-year/

Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F12%3APU101179%21RIV13-MPO-26220___
rdf:type
skos:Concept n14:Vysledek
dcterms:description
The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects. The article deals with the diagnostics application to local defects on the edge in silicon solar cells by monitoring their optical and thermal activities during electrical excitation. During the measurement is solar cell connected to a voltage source in the reverse direction. Radiation generated from reverse-biased pn junction defects is used to study local properties. It proves to be useful to measure surface radiation and to make light spots (defects) localization. By the same way is possible to measure the radiation intensity. We also focused on thermal degradation in stressed regions. To this aim we used an infrared camera and it turns out that temperature degradation could occur in large scale region compare to micro-scale defects.
dcterms:title
Identification of Micro-scale Defects in Crystalline Solar Cell Structure Identification of Micro-scale Defects in Crystalline Solar Cell Structure
skos:prefLabel
Identification of Micro-scale Defects in Crystalline Solar Cell Structure Identification of Micro-scale Defects in Crystalline Solar Cell Structure
skos:notation
RIV/00216305:26220/12:PU101179!RIV13-MPO-26220___
n14:predkladatel
n15:orjk%3A26220
n3:aktivita
n21:P
n3:aktivity
P(FR-TI1/305), P(GAP102/10/2013), P(GD102/09/H074)
n3:dodaniDat
n9:2013
n3:domaciTvurceVysledku
n10:4931637 Dallaeva, Dinara n10:3502465
n3:druhVysledku
n18:D
n3:duvernostUdaju
n22:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
140311
n3:idVysledku
RIV/00216305:26220/12:PU101179
n3:jazykVysledku
n16:eng
n3:klicovaSlova
Solar cell, local defect, fractured surface, nondestructive testing.
n3:klicoveSlovo
n12:local%20defect n12:Solar%20cell n12:nondestructive%20testing. n12:fractured%20surface
n3:kontrolniKodProRIV
[131C62471043]
n3:mistoKonaniAkce
Kazaň
n3:mistoVydani
Kazaň
n3:nazevZdroje
Fracture Mechanics for Durability, Reliability and Safety
n3:obor
n4:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n5:FR-TI1%2F305 n5:GAP102%2F10%2F2013 n5:GD102%2F09%2FH074
n3:rokUplatneniVysledku
n9:2012
n3:tvurceVysledku
Dallaeva, Dinara Šicner, Jiří Koktavý, Pavel
n3:typAkce
n20:EUR
n3:zahajeniAkce
2012-08-26+02:00
s:numberOfPages
8
n6:hasPublisher
Neuveden
n7:isbn
978-5-905576-18-8
n11:organizacniJednotka
26220