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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU95459%21RIV12-MSM-26220___
rdf:type
skos:Concept n12:Vysledek
dcterms:description
We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail. We investigate localized defects in silicon solar cells. These imperfections represent a real problem because they can lead to long-term degradation and decreasing conversion efficiency of solar cells. Thus, this paper presents a systematic optical investigation of local defects and their correlation with rectangular microplasma fluctuations. A sensitive CCD camera has been used for mapping the surface photon emission from localized defects. The operation point of the samples has been set to reverse bias mode and varying electric fields were applied. It turns out that some solar cells exhibit imperfection in the bulk and also close to the cell edges. However, we confine our work here to bulk. Using a combination of optical investigations and electrical noise measurement in the time and spectral domain, we reveal a direct correlation between noise and photon emission. The results for several defect spots are presented in detail.
dcterms:title
Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods
skos:prefLabel
Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods Investigation of the photon emission from the p-n junction of silicon solar cells studied by electro-optical methods
skos:notation
RIV/00216305:26220/11:PU95459!RIV12-MSM-26220___
n12:predkladatel
n18:orjk%3A26220
n3:aktivita
n10:P n10:Z
n3:aktivity
P(GAP102/10/2013), Z(MSM0021630503)
n3:cisloPeriodika
8306
n3:dodaniDat
n4:2012
n3:domaciTvurceVysledku
n14:3502465 n14:3673332 n14:6493645
n3:druhVysledku
n11:J
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
205734
n3:idVysledku
RIV/00216305:26220/11:PU95459
n3:jazykVysledku
n19:eng
n3:klicovaSlova
Solar cell, microplasma noise, local defect, photon emission, electric breakdown
n3:klicoveSlovo
n7:electric%20breakdown n7:Solar%20cell n7:photon%20emission n7:microplasma%20noise n7:local%20defect
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[1F38D1BD03EE]
n3:nazevZdroje
Proceedings of SPIE
n3:obor
n13:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n9:GAP102%2F10%2F2013
n3:rokUplatneniVysledku
n4:2011
n3:svazekPeriodika
8036
n3:tvurceVysledku
Tománek, Pavel Macků, Robert Koktavý, Pavel
n3:zamer
n20:MSM0021630503
s:issn
0277-786X
s:numberOfPages
6
n17:organizacniJednotka
26220