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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU95273%21RIV12-MSM-26220___
rdf:type
n10:Vysledek skos:Concept
dcterms:description
Thick conducting films based on conducting polymer are characterized by DC conductivity and noise in temperature range 10 to 300 K. Conducting polymers could be used e.g. for the top electrode (cathode) in the solid tantalum or niobium capacitors. On the conducting polymer layer the top layer of carbon/graphite and/or silver polymer based pastes is applied in the capacitor technology. Our samples structure consists of conducting polymer layers with semiconductor conductivity applied on the alumina substrate of the size 50 x 4 mm2. Contact electrodes are prepared either from two layers - carbon/graphite paste (lower one) and silver paste (upper one), or by silver paste layer only. We are measuring DC conductivity of the structures, which is of the order of 1 mS at the room temperature and decreases with decreasing temperature for both types of contact technologies. For the evaluation of the contact technology two testing methods are proposed. The first is the measurement of the potential distribution o Thick conducting films based on conducting polymer are characterized by DC conductivity and noise in temperature range 10 to 300 K. Conducting polymers could be used e.g. for the top electrode (cathode) in the solid tantalum or niobium capacitors. On the conducting polymer layer the top layer of carbon/graphite and/or silver polymer based pastes is applied in the capacitor technology. Our samples structure consists of conducting polymer layers with semiconductor conductivity applied on the alumina substrate of the size 50 x 4 mm2. Contact electrodes are prepared either from two layers - carbon/graphite paste (lower one) and silver paste (upper one), or by silver paste layer only. We are measuring DC conductivity of the structures, which is of the order of 1 mS at the room temperature and decreases with decreasing temperature for both types of contact technologies. For the evaluation of the contact technology two testing methods are proposed. The first is the measurement of the potential distribution o
dcterms:title
Noise and Electro-Ultrasonic Spectroscopy of Conducting Polymer Thick Films Noise and Electro-Ultrasonic Spectroscopy of Conducting Polymer Thick Films
skos:prefLabel
Noise and Electro-Ultrasonic Spectroscopy of Conducting Polymer Thick Films Noise and Electro-Ultrasonic Spectroscopy of Conducting Polymer Thick Films
skos:notation
RIV/00216305:26220/11:PU95273!RIV12-MSM-26220___
n10:predkladatel
n19:orjk%3A26220
n3:aktivita
n5:Z n5:P
n3:aktivity
P(GA102/09/1920), P(GD102/09/H074), P(MEB051003), Z(MSM0021630503)
n3:dodaniDat
n6:2012
n3:domaciTvurceVysledku
n9:1629786 n9:6541763 n9:7899696 n9:9770690 n9:3455009
n3:druhVysledku
n18:D
n3:duvernostUdaju
n23:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
216130
n3:idVysledku
RIV/00216305:26220/11:PU95273
n3:jazykVysledku
n14:eng
n3:klicovaSlova
Conducting Polymer, 1/f noise, Electro-Ultrasonic Spectroscopy
n3:klicoveSlovo
n7:Electro-Ultrasonic%20Spectroscopy n7:1%2Ff%20noise n7:Conducting%20Polymer
n3:kontrolniKodProRIV
[DDB794A22BBC]
n3:mistoKonaniAkce
Gdansk
n3:mistoVydani
Gdansk, Poland
n3:nazevZdroje
IMAPS – IEEE CPMT Poland Conference
n3:obor
n4:JA
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
7
n3:projekt
n8:GA102%2F09%2F1920 n8:GD102%2F09%2FH074 n8:MEB051003
n3:rokUplatneniVysledku
n6:2011
n3:tvurceVysledku
Sedlák, Petr Szewczyk, Arkadiusz Kopecký, Martin Majzner, Jiří Sedláková, Vlasta Šikula, Josef Hasse, Lech
n3:typAkce
n21:WRD
n3:zahajeniAkce
2011-11-21+01:00
n3:zamer
n20:MSM0021630503
s:numberOfPages
7
n13:hasPublisher
IMAPS - CPMT IEEE Poland
n22:isbn
978-83-932464-0-3
n17:organizacniJednotka
26220