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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU95007%21RIV12-MSM-26220___
rdf:type
n13:Vysledek skos:Concept
dcterms:description
Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial dama Light emission inspection technique are generally used for the localization of defects. In this paper, the emission comes from reverse biased mono-crystalline solar cells. Firstly, it is demonstrated that light emission of reverse biased solar cells is observable with our system. Experimental data of light emission from cracks, bulk defects, and borders of the cell are presented. Following these measurements, a few scratches were wittingly made on the top side of the solar cell sample and light emission was measured again for the same reverse voltage value. A method for distinguishing micro-crack and scratches from recombination centers is also presented. This method is based on detecting light emission intensity while varying the sample temperature, holding the reverse bias level fixed. The light emission data are then correlated with laser beam induced current maps. It is found that there is a different light emission temperature behavior in the case of bulk recombination defects and artificial dama
dcterms:title
Local measurement of solar cell emission characteristics Local measurement of solar cell emission characteristics
skos:prefLabel
Local measurement of solar cell emission characteristics Local measurement of solar cell emission characteristics
skos:notation
RIV/00216305:26220/11:PU95007!RIV12-MSM-26220___
n13:predkladatel
n19:orjk%3A26220
n3:aktivita
n10:Z n10:P
n3:aktivity
P(GAP102/10/2013), P(LH11060), Z(MSM0021630503)
n3:cisloPeriodika
8306
n3:dodaniDat
n12:2012
n3:domaciTvurceVysledku
n9:6493645 n9:2108585 n9:2967677
n3:druhVysledku
n16:J
n3:duvernostUdaju
n15:S
n3:entitaPredkladatele
n17:predkladatel
n3:idSjednocenehoVysledku
209798
n3:idVysledku
RIV/00216305:26220/11:PU95007
n3:jazykVysledku
n18:eng
n3:klicovaSlova
solar cell, defect characterization, light emission
n3:klicoveSlovo
n6:solar%20cell n6:light%20emission n6:defect%20characterization
n3:kodStatuVydavatele
US - Spojené státy americké
n3:kontrolniKodProRIV
[89F383EB3285]
n3:nazevZdroje
Proceedings of SPIE
n3:obor
n8:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n4:GAP102%2F10%2F2013 n4:LH11060
n3:rokUplatneniVysledku
n12:2011
n3:svazekPeriodika
8036
n3:tvurceVysledku
Grmela, Lubomír Tománek, Pavel Škarvada, Pavel
n3:zamer
n20:MSM0021630503
s:issn
0277-786X
s:numberOfPages
6
n11:organizacniJednotka
26220