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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU93708%21RIV13-MSM-26220___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
The paper shows a procedure for testing linear analog circuits using multi-frequency parametric fault diagnosis. Some methods for test frequency selection determine the total number of test frequencies equal to the total number of tested network parameters. The error between actual and estimated network parameters is evaluated only on several frequencies while the rest of the frequency band of the circuit is not taken into account. A new approach based on an overdetermined system of fault equations which can dramatically reduce the total error of the solution is presented. A practical example of application is shown on the test frequency selection of an EMI filter. The paper shows a procedure for testing linear analog circuits using multi-frequency parametric fault diagnosis. Some methods for test frequency selection determine the total number of test frequencies equal to the total number of tested network parameters. The error between actual and estimated network parameters is evaluated only on several frequencies while the rest of the frequency band of the circuit is not taken into account. A new approach based on an overdetermined system of fault equations which can dramatically reduce the total error of the solution is presented. A practical example of application is shown on the test frequency selection of an EMI filter.
dcterms:title
Parametric Fault Diagnosis using Overdetermined System of Fault Equations Parametric Fault Diagnosis using Overdetermined System of Fault Equations
skos:prefLabel
Parametric Fault Diagnosis using Overdetermined System of Fault Equations Parametric Fault Diagnosis using Overdetermined System of Fault Equations
skos:notation
RIV/00216305:26220/11:PU93708!RIV13-MSM-26220___
n18:predkladatel
n20:orjk%3A26220
n3:aktivita
n5:S n5:P n5:Z
n3:aktivity
P(EE2.3.20.0007), P(FR-TI1/184), P(FR-TI2/194), P(GAP102/10/1665), P(GD102/08/H027), P(OC09016), S, Z(MSM0021630513)
n3:dodaniDat
n6:2013
n3:domaciTvurceVysledku
n4:1467379 n4:7091826
n3:druhVysledku
n16:D
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n12:predkladatel
n3:idSjednocenehoVysledku
219548
n3:idVysledku
RIV/00216305:26220/11:PU93708
n3:jazykVysledku
n11:eng
n3:klicovaSlova
Fault diagnosis, parameter estimation, testability, test frequency selection, overdetermined system.
n3:klicoveSlovo
n13:overdetermined%20system. n13:parameter%20estimation n13:Fault%20diagnosis n13:testability n13:test%20frequency%20selection
n3:kontrolniKodProRIV
[4EC74DB9CEAF]
n3:mistoKonaniAkce
Tel Aviv
n3:mistoVydani
Israel
n3:nazevZdroje
Proceedings of the International IEEE Conference COMCAS 2011
n3:obor
n15:JA
n3:pocetDomacichTvurcuVysledku
2
n3:pocetTvurcuVysledku
2
n3:projekt
n10:EE2.3.20.0007 n10:GAP102%2F10%2F1665 n10:FR-TI2%2F194 n10:OC09016 n10:GD102%2F08%2FH027 n10:FR-TI1%2F184
n3:rokUplatneniVysledku
n6:2011
n3:tvurceVysledku
Kolka, Zdeněk Kincl, Zdeněk
n3:typAkce
n22:WRD
n3:zahajeniAkce
2011-11-07+01:00
n3:zamer
n8:MSM0021630513
s:numberOfPages
4
n17:hasPublisher
Neuveden
n7:isbn
978-1-4577-1692-8
n21:organizacniJednotka
26220