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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU90188%21RIV11-GA0-26220___
rdf:type
skos:Concept n18:Vysledek
dcterms:description
PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. These are caused by localized areas with high donor or acceptor doping agents, impurities, dislocations or other mechanisms which effect in lower breakdown voltage of PN junction in reverse bias. Several base methods can be used for solar cells nondestructive diagnostics. Measuring methods of low-band noise current effective value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection of microplasma noise. This noise is an impulse noise and it is caused by local avalanche breakdowns in small area of the junction. It can be recognized by two or more level random square current pulses with constant height, random appearance time and random PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. These are caused by localized areas with high donor or acceptor doping agents, impurities, dislocations or other mechanisms which effect in lower breakdown voltage of PN junction in reverse bias. Several base methods can be used for solar cells nondestructive diagnostics. Measuring methods of low-band noise current effective value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection of microplasma noise. This noise is an impulse noise and it is caused by local avalanche breakdowns in small area of the junction. It can be recognized by two or more level random square current pulses with constant height, random appearance time and random
dcterms:title
PN junction defects detection in solar cells using noise diagnostics PN junction defects detection in solar cells using noise diagnostics
skos:prefLabel
PN junction defects detection in solar cells using noise diagnostics PN junction defects detection in solar cells using noise diagnostics
skos:notation
RIV/00216305:26220/11:PU90188!RIV11-GA0-26220___
n18:predkladatel
n20:orjk%3A26220
n3:aktivita
n13:P n13:Z
n3:aktivity
P(GAP102/10/2013), Z(MSM0021630503)
n3:cisloPeriodika
1
n3:dodaniDat
n5:2011
n3:domaciTvurceVysledku
n14:3502465 n14:3673332 n14:2704021
n3:druhVysledku
n15:J
n3:duvernostUdaju
n16:S
n3:entitaPredkladatele
n9:predkladatel
n3:idSjednocenehoVysledku
220637
n3:idVysledku
RIV/00216305:26220/11:PU90188
n3:jazykVysledku
n6:eng
n3:klicovaSlova
Solar cell, noise diagnostics, PN junction, local defects, microplasma, avalanche breakdown
n3:klicoveSlovo
n8:PN%20junction n8:noise%20diagnostics n8:avalanche%20breakdown n8:microplasma n8:Solar%20cell n8:local%20defects
n3:kodStatuVydavatele
CH - Švýcarská konfederace
n3:kontrolniKodProRIV
[96E144D9F67C]
n3:nazevZdroje
Key Engineering Materials
n3:obor
n4:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n12:GAP102%2F10%2F2013
n3:rokUplatneniVysledku
n5:2011
n3:svazekPeriodika
465
n3:tvurceVysledku
Macků, Robert Paračka, Petr Koktavý, Pavel
n3:zamer
n17:MSM0021630503
s:issn
1662-9795
s:numberOfPages
4
n19:organizacniJednotka
26220