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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F11%3APU89956%21RIV11-GA0-26220___
rdf:type
n10:Vysledek skos:Concept
dcterms:description
This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed. This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.
dcterms:title
Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure
skos:prefLabel
Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure
skos:notation
RIV/00216305:26220/11:PU89956!RIV11-GA0-26220___
n10:predkladatel
n11:orjk%3A26220
n4:aktivita
n5:P n5:Z
n4:aktivity
P(GAP102/10/2013), Z(MSM0021630503)
n4:cisloPeriodika
1
n4:dodaniDat
n16:2011
n4:domaciTvurceVysledku
n6:3502465 n6:2967677 n6:3673332
n4:druhVysledku
n8:J
n4:duvernostUdaju
n14:S
n4:entitaPredkladatele
n20:predkladatel
n4:idSjednocenehoVysledku
216189
n4:idVysledku
RIV/00216305:26220/11:PU89956
n4:jazykVysledku
n19:eng
n4:klicovaSlova
Solar cell, Microplasma noise, Non-destructive testing, Local defect
n4:klicoveSlovo
n7:Local%20defect n7:Solar%20cell n7:Non-destructive%20testing n7:Microplasma%20noise
n4:kodStatuVydavatele
CH - Švýcarská konfederace
n4:kontrolniKodProRIV
[56A465DDD4BD]
n4:nazevZdroje
Key Engineering Materials
n4:obor
n17:BM
n4:pocetDomacichTvurcuVysledku
3
n4:pocetTvurcuVysledku
3
n4:projekt
n18:GAP102%2F10%2F2013
n4:rokUplatneniVysledku
n16:2011
n4:svazekPeriodika
465
n4:tvurceVysledku
Koktavý, Pavel Macků, Robert Škarvada, Pavel
n4:zamer
n15:MSM0021630503
s:issn
1662-9795
s:numberOfPages
4
n13:organizacniJednotka
26220