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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F10%3APU89315%21RIV11-GA0-26220___
rdf:type
skos:Concept n14:Vysledek
dcterms:description
The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than The Mean Time to Failure (MTTF) method is usually applied as the standard conventional reliability test for Multilayer Ceramic Capacitors (MLCC). We propose a reliability test based on the leakage current and the low frequency noise spectral density evaluation. Both the leakage current and 1/f noise amplitudes give time saving reliability information much faster than those of the conventional MTTF method. We have measured the DC leakage currents of MLCCs and found from the VA characteristics evaluation that the Poole-Frenkel (PF) transport mechanism is dominant in the samples for the low electric field - applied voltage results indicate the typical Poole-Frenkel electron transport in the insulating BaTiO3 layers, giving the PF constants and the barrier heights. The low frequency noise characteristics are observed at a proper combination of the measuring circuits, and the normalized noise amplitudes are obtained as the function of the MLCC series resistance. The 1/f noise amplitudes are found more than
dcterms:title
LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs
skos:prefLabel
LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs LEAKAGE CURRENT, NOISE AND RELIABILITY OF HIGH VOLTAGE MLCCs
skos:notation
RIV/00216305:26220/10:PU89315!RIV11-GA0-26220___
n3:aktivita
n4:Z n4:P
n3:aktivity
P(GA102/09/1920), Z(MSM0021630503)
n3:dodaniDat
n5:2011
n3:domaciTvurceVysledku
n6:9770690 n6:7899696 n6:6541763
n3:druhVysledku
n17:D
n3:duvernostUdaju
n22:S
n3:entitaPredkladatele
n18:predkladatel
n3:idSjednocenehoVysledku
268070
n3:idVysledku
RIV/00216305:26220/10:PU89315
n3:jazykVysledku
n10:eng
n3:klicovaSlova
LEAKAGE CURRENT, NOISE, RELIABILITY , HIGH VOLTAGE ,MLCCs
n3:klicoveSlovo
n9:LEAKAGE%20CURRENT n9:HIGH%20VOLTAGE%20 n9:RELIABILITY%20 n9:NOISE n9:MLCCs
n3:kontrolniKodProRIV
[9B626850725F]
n3:mistoKonaniAkce
New Orleans
n3:mistoVydani
USA,New Orleans
n3:nazevZdroje
CARTS USA 2010 PROCEEDINGS
n3:obor
n19:JA
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
7
n3:projekt
n15:GA102%2F09%2F1920
n3:rokUplatneniVysledku
n5:2010
n3:tvurceVysledku
Tacano, Munecazu Morohoshi, Y. Tanuma, Nobuhisa Šikula, Josef Ohya, H. Sedláková, Vlasta Kopecký, Martin
n3:typAkce
n7:WRD
n3:zahajeniAkce
2010-03-15+01:00
n3:zamer
n21:MSM0021630503
s:numberOfPages
7
n12:hasPublisher
Electronic Components Association
n16:isbn
0-7908-0150-7
n13:organizacniJednotka
26220