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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F10%3APU89312%21RIV11-GA0-26220___
rdf:type
skos:Concept n14:Vysledek
dcterms:description
Non-destructive methods for the quality characterization and reliability prediction of passive electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, and electro-ultrasonic spectroscopy. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicators for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then both leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signals can be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component is more sensitive to Non-destructive methods for the quality characterization and reliability prediction of passive electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, and electro-ultrasonic spectroscopy. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicators for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then both leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signals can be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component is more sensitive to
dcterms:title
RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING
skos:prefLabel
RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING RELIABILITY OF PASSIVE ELECTRONIC DEVICES: FAILURE MECHANISMS AND TESTING
skos:notation
RIV/00216305:26220/10:PU89312!RIV11-GA0-26220___
n3:aktivita
n16:P n16:Z
n3:aktivity
P(GA102/09/1920), Z(MSM0021630503)
n3:dodaniDat
n10:2011
n3:domaciTvurceVysledku
n7:7899696 n7:1629786 n7:9770690 n7:8995923 n7:6541763
n3:druhVysledku
n11:D
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n22:predkladatel
n3:idSjednocenehoVysledku
284714
n3:idVysledku
RIV/00216305:26220/10:PU89312
n3:jazykVysledku
n12:eng
n3:klicovaSlova
RELIABILITY ,PASSIVE ELECTRONIC DEVICES, FAILURE MECHANISMS, TESTING
n3:klicoveSlovo
n6:FAILURE%20MECHANISMS n6:TESTING n6:RELIABILITY%20 n6:PASSIVE%20ELECTRONIC%20DEVICES
n3:kontrolniKodProRIV
[8006A75CF32A]
n3:mistoKonaniAkce
New Orleans
n3:mistoVydani
USA,New Orleans
n3:nazevZdroje
CARTS USA 2010 PROCEEDINGS
n3:obor
n13:JA
n3:pocetDomacichTvurcuVysledku
5
n3:pocetTvurcuVysledku
6
n3:projekt
n21:GA102%2F09%2F1920
n3:rokUplatneniVysledku
n10:2010
n3:tvurceVysledku
Tacano, Munecazu Sedláková, Vlasta Zedníček, Tomáš Šikula, Josef Kopecký, Martin Majzner, Jiří
n3:typAkce
n5:WRD
n3:zahajeniAkce
2010-03-15+01:00
n3:zamer
n4:MSM0021630503
s:numberOfPages
21
n15:hasPublisher
Electronic Components Association
n18:isbn
0-7908-0150-7
n17:organizacniJednotka
26220