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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F10%3APU89113%21RIV11-GA0-26220___
rdf:type
n11:Vysledek skos:Concept
dcterms:description
This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed. This article discusses the issue of noise measurements application for the quality assessment of the solar cells themselves and production technology alike. The main focus of our research is the random n-level (in most case just two-level) impulse noise, usually referred to as microplasma noise. This noise was found to be in a direct consequence of local breakdowns in micro-sized regions and brings about a reduction of lifetime or a destruction of the pn junction. Non-destructive measurement methodology as presented here is suitable for testing of a large number of various semiconductor devices not only for solar cells. In this paper experimental measurement of noise signals in the frequency and time domain is presented. Furthermore the microplasma noise behaviour and defect geometry is discussed.
dcterms:title
Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure
skos:prefLabel
Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure Non-destructive Characterization of Micro-sized Defects in the Solar Cell Structure
skos:notation
RIV/00216305:26220/10:PU89113!RIV11-GA0-26220___
n3:aktivita
n13:P n13:Z
n3:aktivity
P(GAP102/10/2013), Z(MSM0021630503)
n3:dodaniDat
n15:2011
n3:domaciTvurceVysledku
n7:2967677 n7:3502465 n7:3673332
n3:druhVysledku
n9:O
n3:duvernostUdaju
n4:S
n3:entitaPredkladatele
n16:predkladatel
n3:idSjednocenehoVysledku
274993
n3:idVysledku
RIV/00216305:26220/10:PU89113
n3:jazykVysledku
n6:eng
n3:klicovaSlova
Solar cell, Microplasma noise, Non-destructive testing, Local defect
n3:klicoveSlovo
n5:Non-destructive%20testing n5:Solar%20cell n5:Local%20defect n5:Microplasma%20noise
n3:kontrolniKodProRIV
[23E9E9B3E93E]
n3:obor
n8:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n17:GAP102%2F10%2F2013
n3:rokUplatneniVysledku
n15:2010
n3:tvurceVysledku
Škarvada, Pavel Koktavý, Pavel Macků, Robert
n3:zamer
n18:MSM0021630503
n14:organizacniJednotka
26220