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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F10%3APU88504%21RIV11-GA0-26220___
rdf:type
skos:Concept n13:Vysledek
dcterms:description
The one of the very important aims of modern technologies is better understanding of organic semiconductors to be able to spread them to different electronic branches. There are only particular explanations of processes within the organic material and boundaries of this material are not comparable with processes explanations for non organic semiconductors. One of the areas of interesets for near future is noise behavior depending on wide parameter spectrum. For the purpose of organic semiconductor noise investigation the unit for measuring has been designed, this article is the crucial basement for noise characterization setup design, realization and usage, some for organic FET based on pentacene will be shown and discussed. The one of the very important aims of modern technologies is better understanding of organic semiconductors to be able to spread them to different electronic branches. There are only particular explanations of processes within the organic material and boundaries of this material are not comparable with processes explanations for non organic semiconductors. One of the areas of interesets for near future is noise behavior depending on wide parameter spectrum. For the purpose of organic semiconductor noise investigation the unit for measuring has been designed, this article is the crucial basement for noise characterization setup design, realization and usage, some for organic FET based on pentacene will be shown and discussed.
dcterms:title
Noise Characterization Setup for Organic Field Effect Transistors Noise Characterization Setup for Organic Field Effect Transistors
skos:prefLabel
Noise Characterization Setup for Organic Field Effect Transistors Noise Characterization Setup for Organic Field Effect Transistors
skos:notation
RIV/00216305:26220/10:PU88504!RIV11-GA0-26220___
n3:aktivita
n5:P n5:Z
n3:aktivity
P(GD102/09/H074), Z(MSM0021630503)
n3:dodaniDat
n8:2011
n3:domaciTvurceVysledku
n10:8315108 n10:3502465 n10:4427378
n3:druhVysledku
n9:D
n3:duvernostUdaju
n18:S
n3:entitaPredkladatele
n22:predkladatel
n3:idSjednocenehoVysledku
274951
n3:idVysledku
RIV/00216305:26220/10:PU88504
n3:jazykVysledku
n7:eng
n3:klicovaSlova
Organic semiconductor, OFET, noise characterization, pentacene
n3:klicoveSlovo
n12:OFET n12:pentacene n12:noise%20characterization n12:Organic%20semiconductor
n3:kontrolniKodProRIV
[D0B1B9E327A2]
n3:mistoKonaniAkce
Brno
n3:mistoVydani
Brno
n3:nazevZdroje
IMAPS CS International Conference 2010 - Proceedings
n3:obor
n21:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:projekt
n15:GD102%2F09%2FH074
n3:rokUplatneniVysledku
n8:2010
n3:tvurceVysledku
Koktavý, Pavel Knápek, Alexandr Krčál, Ondřej
n3:typAkce
n14:WRD
n3:zahajeniAkce
2010-09-01+02:00
n3:zamer
n16:MSM0021630503
s:numberOfPages
5
n11:hasPublisher
Vysoké učení technické v Brně
n20:isbn
978-80-214-4138-5
n17:organizacniJednotka
26220