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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F10%3APU86780%21RIV11-MSM-26220___
rdf:type
skos:Concept n20:Vysledek
dcterms:description
The paper describes an application for testing of a fault indicator but it could be used for other network protection testing. The application is created in the LabVIEW environment and consists of three parts. The first part of the application is determined for transient phe-nomenon generation and imitates voltage and current transient signal at ground fault origi-nate. The second part allows to set sequences of trend for each current and voltage output signal, up to six trends for each phase. The last part of the application generates harmonic signal with continuously controllable amplitude of current or voltage output signal and phase shift of each signal can be changed there. Further any sub-harmonics and upper-harmonics can be added to selected current output signal The paper describes an application for testing of a fault indicator but it could be used for other network protection testing. The application is created in the LabVIEW environment and consists of three parts. The first part of the application is determined for transient phe-nomenon generation and imitates voltage and current transient signal at ground fault origi-nate. The second part allows to set sequences of trend for each current and voltage output signal, up to six trends for each phase. The last part of the application generates harmonic signal with continuously controllable amplitude of current or voltage output signal and phase shift of each signal can be changed there. Further any sub-harmonics and upper-harmonics can be added to selected current output signal
dcterms:title
Transient Signal Generator for Fault Indicator Testing Transient Signal Generator for Fault Indicator Testing
skos:prefLabel
Transient Signal Generator for Fault Indicator Testing Transient Signal Generator for Fault Indicator Testing
skos:notation
RIV/00216305:26220/10:PU86780!RIV11-MSM-26220___
n3:aktivita
n15:S
n3:aktivity
S
n3:dodaniDat
n4:2011
n3:domaciTvurceVysledku
n12:3056309
n3:druhVysledku
n11:D
n3:duvernostUdaju
n19:S
n3:entitaPredkladatele
n14:predkladatel
n3:idSjednocenehoVysledku
293329
n3:idVysledku
RIV/00216305:26220/10:PU86780
n3:jazykVysledku
n10:eng
n3:klicovaSlova
LabVIEW, ground fault, generator, testing, fault indicator
n3:klicoveSlovo
n5:ground%20fault n5:LabVIEW n5:fault%20indicator n5:generator n5:testing
n3:kontrolniKodProRIV
[A0EFA2E23011]
n3:mistoKonaniAkce
FEKT VUT v Brně
n3:mistoVydani
Ondráčková 105, Brno
n3:nazevZdroje
Proceedings of the 16th conference STUDENT EEICT 2010 Volume 4
n3:obor
n17:JE
n3:pocetDomacichTvurcuVysledku
1
n3:pocetTvurcuVysledku
1
n3:rokUplatneniVysledku
n4:2010
n3:tvurceVysledku
Topolánek, David
n3:typAkce
n7:CST
n3:zahajeniAkce
2010-04-29+02:00
s:numberOfPages
5
n6:hasPublisher
Ing.Zdeněk Novotný CSc.,
n16:isbn
978-80-214-4079-1
n13:organizacniJednotka
26220