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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F09%3APU82502%21RIV10-MSM-26220___
rdf:type
skos:Concept n11:Vysledek
dcterms:description
Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individual molecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowing measurements
dcterms:title
Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers
skos:prefLabel
Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers
skos:notation
RIV/00216305:26220/09:PU82502!RIV10-MSM-26220___
n3:aktivita
n10:Z
n3:aktivity
Z(MSM0021630503)
n3:dodaniDat
n18:2010
n3:domaciTvurceVysledku
n12:6039618 Abuetwirat, Inas Faisel n12:5456762
n3:druhVysledku
n19:D
n3:duvernostUdaju
n9:S
n3:entitaPredkladatele
n6:predkladatel
n3:idSjednocenehoVysledku
310408
n3:idVysledku
RIV/00216305:26220/09:PU82502
n3:jazykVysledku
n16:eng
n3:klicovaSlova
Dielectrics, relaxation, molecular dynamics, spectroscopy, tantalum oxide
n3:klicoveSlovo
n7:Dielectrics n7:spectroscopy n7:relaxation n7:tantalum%20oxide n7:molecular%20dynamics
n3:kontrolniKodProRIV
[5FF7ED46C6FC]
n3:mistoKonaniAkce
Košice
n3:mistoVydani
Košice, SLovenská republika
n3:nazevZdroje
Physics of Materials 2009
n3:obor
n13:BM
n3:pocetDomacichTvurcuVysledku
3
n3:pocetTvurcuVysledku
3
n3:rokUplatneniVysledku
n18:2009
n3:tvurceVysledku
Abuetwirat, Inas Faisel Holcman, Vladimír Liedermann, Karel
n3:typAkce
n20:WRD
n3:zahajeniAkce
2009-10-14+02:00
n3:zamer
n21:MSM0021630503
s:numberOfPages
4
n14:hasPublisher
FEI TU Košiče
n4:isbn
978-80-8086-122-3
n17:organizacniJednotka
26220