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Statements

Subject Item
n2:RIV%2F00216305%3A26220%2F09%3APU81660%21RIV10-MSM-26220___
rdf:type
n7:Vysledek skos:Concept
dcterms:description
We have studied the interface resistance between the polymer based conducting and resistive thick film layers. The samples were made using different resistive pastes and dipping silvers. The composite of carbon and graphite (C/Gr) conducting particles suspended in different polymer vehicles were used for the thick film resistive layers preparation. Interface resistance RI created between the contact layer made from dipping silver (DiAg) and resistive layer was determined from the surface potential distribution measurements and its value was less than 1% of total sample resistance. Measuring apparatus DISPOT designed in our laboratory provides the measuring of a surface potential distribution. The measuring probe is sliding on the surface of measured structure and potential change between the successive steps is normalized by the total current flowing through the structure. Elementary step (the shortest distance between two measurements) is 1.25 m. The equipment is arranged for current and voltage fou We have studied the interface resistance between the polymer based conducting and resistive thick film layers. The samples were made using different resistive pastes and dipping silvers. The composite of carbon and graphite (C/Gr) conducting particles suspended in different polymer vehicles were used for the thick film resistive layers preparation. Interface resistance RI created between the contact layer made from dipping silver (DiAg) and resistive layer was determined from the surface potential distribution measurements and its value was less than 1% of total sample resistance. Measuring apparatus DISPOT designed in our laboratory provides the measuring of a surface potential distribution. The measuring probe is sliding on the surface of measured structure and potential change between the successive steps is normalized by the total current flowing through the structure. Elementary step (the shortest distance between two measurements) is 1.25 m. The equipment is arranged for current and voltage fou
dcterms:title
Interface Resistance between Polymer Based Conducting and Resistive Layers Interface Resistance between Polymer Based Conducting and Resistive Layers
skos:prefLabel
Interface Resistance between Polymer Based Conducting and Resistive Layers Interface Resistance between Polymer Based Conducting and Resistive Layers
skos:notation
RIV/00216305:26220/09:PU81660!RIV10-MSM-26220___
n3:aktivita
n4:P n4:Z
n3:aktivity
P(GD102/09/H074), Z(MSM0021630503)
n3:dodaniDat
n16:2010
n3:domaciTvurceVysledku
n9:6541763 n9:5802407 n9:6209947 n9:1629786
n3:druhVysledku
n18:D
n3:duvernostUdaju
n10:S
n3:entitaPredkladatele
n21:predkladatel
n3:idSjednocenehoVysledku
320011
n3:idVysledku
RIV/00216305:26220/09:PU81660
n3:jazykVysledku
n19:eng
n3:klicovaSlova
interface resistance, 1/f noise, non-linearity, polymer based TFR
n3:klicoveSlovo
n17:1%2Ff%20noise n17:non-linearity n17:interface%20resistance n17:polymer%20based%20TFR
n3:kontrolniKodProRIV
[92C7E04D3025]
n3:mistoKonaniAkce
Rimini
n3:mistoVydani
Italie
n3:nazevZdroje
17th European Microelectronics and Packaging Conference & Exhibition
n3:obor
n5:BE
n3:pocetDomacichTvurcuVysledku
4
n3:pocetTvurcuVysledku
4
n3:projekt
n14:GD102%2F09%2FH074
n3:rokUplatneniVysledku
n16:2009
n3:tvurceVysledku
Tofel, Pavel Chvátal, Miloš Majzner, Jiří Sedláková, Vlasta
n3:typAkce
n20:WRD
n3:zahajeniAkce
2009-06-15+02:00
n3:zamer
n13:MSM0021630503
s:numberOfPages
4
n11:hasPublisher
Neuveden
n12:isbn
978-1-4244-4722-0
n22:organizacniJednotka
26220